Time resolved X-ray diffraction measurements for a single sub-micrometer particle using an optical-trap sample holder
| Project/Area Number |
25390012
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Nanostructural physics
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| Research Institution | Japan Synchrotron Radiation Research Institute |
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Principal Investigator |
Fukuyama Yoshimitsu 公益財団法人高輝度光科学研究センター, 利用研究促進部門, 研究員 (20332249)
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| Project Period (FY) |
2013-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2015: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2014: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2013: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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| Keywords | ナノ構造物性 / ナノ・マイクロ科学 / 微粒子トラップ |
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| Outline of Final Research Achievements |
Time resolved X-ray diffraction measurement system has been developed for a single sub-micrometer particle using an optical-trap sample holder and a high-flux focused synchrotron radiation beam. By using the optical-trap sample holder with intensity modulation, temperature of a single sub-micrometer particle was determined. The quality of the X-ray diffraction image by using the optical-trap sample holder was comparable to that of particle assemblage in a glass capillary.
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Report
(4 results)
Research Products
(3 results)
