Time resolved X-ray diffraction measurements for a single sub-micrometer particle using an optical-trap sample holder

Research Project

Project/Area Number	25390012
Research Category	Grant-in-Aid for Scientific Research (C)
Allocation Type	Multi-year Fund
Section	一般
Research Field	Nanostructural physics
Research Institution	Japan Synchrotron Radiation Research Institute
Principal Investigator	Fukuyama Yoshimitsu 公益財団法人高輝度光科学研究センター, 利用研究促進部門, 研究員 (20332249)
Project Period (FY)	2013-04-01 – 2016-03-31
Project Status	Completed (Fiscal Year 2015)
Budget Amount *help	¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000) Fiscal Year 2015: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000) Fiscal Year 2014: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000) Fiscal Year 2013: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Keywords	ナノ構造物性 / ナノ・マイクロ科学 / 微粒子トラップ
Outline of Final Research Achievements	Time resolved X-ray diffraction measurement system has been developed for a single sub-micrometer particle using an optical-trap sample holder and a high-flux focused synchrotron radiation beam. By using the optical-trap sample holder with intensity modulation, temperature of a single sub-micrometer particle was determined. The quality of the X-ray diffraction image by using the optical-trap sample holder was comparable to that of particle assemblage in a glass capillary.

Report

(4 results)