A study on X-ray aided non-contact atomic force microscopy (XANAM) in terms of quantum interference
| Project/Area Number |
25390079
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Nagoya University |
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Principal Investigator |
Shushi Suzuki 名古屋大学, 工学(系)研究科(研究院), 准教授 (30322853)
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| Project Period (FY) |
2013-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2015: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2014: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2013: ¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
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| Keywords | 走査プローブ顕微鏡（SPM） / 非接触原子間力顕微鏡（NC-AFM） / 量子ビーム / 放射光X線 / 表面元素分析 / 力場解析 / 非接触原子間力顕微鏡 / 力成分解析 / 探針-試料間相互作用 / 共有結合 / 内殻電子励起 / X線誘起信号 / 元素マッピング / 走査プローブ顕微鏡 / X線誘起 / 量子干渉 / 化学結合 / X線吸収 |
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| Outline of Final Research Achievements |
Development of chemically sensitive atomic force microscopy (AFM) is one of the challenging issue for surface science at the nanoscale. In this study, X-ray Aided Noncontact Atomic force microscopy (XANAM) was developed for nano-scale elemental surface analysis in combination with the Synchrotron radiation X-ray techniques. X-ray can excite inner core shell electrons of an atom on a sample with tuning its energy into specific absorption energy to the atom. A proposed mechanisms of XANAM, utilizing the tip-surface interaction change which induced by X-ray absorption core level electron excitation, was proved experimentally with theoretical analysis. A preliminary data was obtained for the elemental mapping.
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Report
(4 results)
Research Products
(27 results)
