| Budget Amount *help |
¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2015: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2014: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2013: ¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
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| Outline of Final Research Achievements |
Development of chemically sensitive atomic force microscopy (AFM) is one of the challenging issue for surface science at the nanoscale. In this study, X-ray Aided Noncontact Atomic force microscopy (XANAM) was developed for nano-scale elemental surface analysis in combination with the Synchrotron radiation X-ray techniques. X-ray can excite inner core shell electrons of an atom on a sample with tuning its energy into specific absorption energy to the atom. A proposed mechanisms of XANAM, utilizing the tip-surface interaction change which induced by X-ray absorption core level electron excitation, was proved experimentally with theoretical analysis. A preliminary data was obtained for the elemental mapping.
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