Characterization and reactivity of nickel(IV) and copper(IV) complexes and their oxidation state equivalents
| Project/Area Number |
25410060
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (C)
|
| Allocation Type | Multi-year Fund |
|---|
| Section | 一般 |
|---|
| Research Field |
Inorganic chemistry
|
|---|
| Research Institution | Ibaraki University |
|---|
Principal Investigator |
|
|---|
| Project Period (FY) |
2013-04-01 – 2016-03-31
|
| Project Status |
Completed (Fiscal Year 2015)
|
| Budget Amount *help |
¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000)
Fiscal Year 2015: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2014: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2013: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
|
|---|
| Keywords | 酸化 / 銅(IV) / ニッケル(IV) / フェノキシルラジカル / 酸化数 / 銅 / 高原子価 / ニッケル |
|---|
| Outline of Final Research Achievements |
It is well-known that the metal ion can be obtained by oxidation of elemental metal. For example, copper(II) ion showing the blue color is formed by the oxidation of copper metal. The highest valence state of copper ion can be considered to be +IV state in general. However formation of the highest valence state of the metal ions are quite difficult due to their instability, and therefore detailed properties of the highest valence state metal complexes are still unclear. In this project, determination of the detailed electronic structures of the highest oxidation state of metal complexes, especially copper(IV) and nickel(IV) complexes as formal oxidation number with diphenolate salen ligand, has been attempted.
|
Report
(4 results)
Research Products
(26 results)
-
-
-
-
-
[Journal Article] Influence of ligand flexibility on the electronic structure of oxidized Ni(III)-phenoxide complexes2014
Author(s)
M. Kawai, T. Yamaguchi, S. Masaoka, F. Tani, T. Kohzuma, L. Chiang, T. Storr, K. Mieda, T. Ogura, r. K. Szilagyi, and Y. Shimazaki
-
Journal Title
Inorganic Chemistry
Volume: 53
Issue: 19
Pages: 10195-10202
DOI
Related Report
Peer Reviewed
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
