| Budget Amount *help |
¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2016: ¥130,000 (Direct Cost: ¥100,000、Indirect Cost: ¥30,000)
Fiscal Year 2015: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2014: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2013: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
|
|---|
| Outline of Final Research Achievements |
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a powerful analysis method because it provides detailed chemical images with high spatial resolution approximately 100 nm. However, it is often difficult to interpret TOF-SIMS data, especially for the analysis of unknown materials in multicomponent samples, due to complex spectrum information. New analysis protocols for identification and imaging of molecules in complex samples using TOF-SIMS and near-field infrared microscopy, which also provides chemical mapping, have been developed.
|
