Development of a charged-droplet beam source for secondary ion mass spectrometry using ionic liquids
Project/Area Number |
25410163
|
Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Multi-year Fund |
Section | 一般 |
Research Field |
Analytical chemistry
|
Research Institution | National Institute of Advanced Industrial Science and Technology |
Principal Investigator |
Fujiwara Yukio 国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 (60415742)
|
Project Period (FY) |
2013-04-01 – 2016-03-31
|
Project Status |
Completed (Fiscal Year 2015)
|
Budget Amount *help |
¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2015: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2014: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2013: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
|
Keywords | 二次イオン / SIMS / イオン源 / イオンビーム / イオン液体 / エレクトロスプレー / クラスター / 帯電液滴 / 表面分析 / 二次イオン質量分析 / ビーム / プロトン付加 |
Outline of Final Research Achievements |
To develop an ion source capable of producing a charged-droplet beam for secondary ion mass spectrometry (SIMS), vacuum electrospray of ionic liquids was investigated. A time-of-flight (TOF) SIMS system was then developed using a vacuum-electrospay primary beam source that is capable of producing a continuous ion beam of an ionic liquid. A primary ion beam of an imidazolium ionic liquid was irradiated to analyze organic samples using the TOF-SIMS system. Obtained secondary ion mass spectra demonstrated that the vacuum electrospray of the ionic liquid was applicable to a primary ion beam source for SIMS.
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Report
(4 results)
Research Products
(13 results)