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Development of a charged-droplet beam source for secondary ion mass spectrometry using ionic liquids

Research Project

Project/Area Number 25410163
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Research Field Analytical chemistry
Research InstitutionNational Institute of Advanced Industrial Science and Technology

Principal Investigator

Fujiwara Yukio  国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 (60415742)

Project Period (FY) 2013-04-01 – 2016-03-31
Project Status Completed (Fiscal Year 2015)
Budget Amount *help
¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2015: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2014: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2013: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
Keywords二次イオン / SIMS / イオン源 / イオンビーム / イオン液体 / エレクトロスプレー / クラスター / 帯電液滴 / 表面分析 / 二次イオン質量分析 / ビーム / プロトン付加
Outline of Final Research Achievements

To develop an ion source capable of producing a charged-droplet beam for secondary ion mass spectrometry (SIMS), vacuum electrospray of ionic liquids was investigated. A time-of-flight (TOF) SIMS system was then developed using a vacuum-electrospay primary beam source that is capable of producing a continuous ion beam of an ionic liquid. A primary ion beam of an imidazolium ionic liquid was irradiated to analyze organic samples using the TOF-SIMS system. Obtained secondary ion mass spectra demonstrated that the vacuum electrospray of the ionic liquid was applicable to a primary ion beam source for SIMS.

Report

(4 results)
  • 2015 Annual Research Report   Final Research Report ( PDF )
  • 2014 Research-status Report
  • 2013 Research-status Report
  • Research Products

    (13 results)

All 2016 2015 2014 Other

All Journal Article (4 results) (of which Peer Reviewed: 4 results) Presentation (9 results) (of which Int'l Joint Research: 1 results,  Invited: 1 results)

  • [Journal Article] Effects of a proton-conducting ionic liquid on secondary ion formation in time-of-flight secondary ion mass spectrometry2016

    • Author(s)
      Y. Fujiwara, N. Saito
    • Journal Title

      Rapid Commun. Mass Spectrom.

      Volume: 30 Issue: 1 Pages: 239-249

    • DOI

      10.1002/rcm.7439

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate2015

    • Author(s)
      Y. Fujiwara, N. Saito
    • Journal Title

      Applied Physics Express

      Volume: 8 Issue: 7 Pages: 076601-076601

    • DOI

      10.7567/apex.8.076601

    • NAID

      210000137595

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) using an ionic-liquid primary ion beam source2014

    • Author(s)
      Yukio Fujiwara, Naoaki Saito
    • Journal Title

      Surface and Interface Analysis

      Volume: 46 Issue: S1 Pages: 348-352

    • DOI

      10.1002/sia.5662

    • Related Report
      2014 Research-status Report
    • Peer Reviewed
  • [Journal Article] Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS)2014

    • Author(s)
      Yukio Fujiwara, Naoaki Saito
    • Journal Title

      e-Journal of Surface Science and Nanotechnology

      Volume: 12 Issue: 0 Pages: 119-123

    • DOI

      10.1380/ejssnt.2014.119

    • NAID

      130004933808

    • ISSN
      1348-0391
    • Related Report
      2013 Research-status Report
    • Peer Reviewed
  • [Presentation] プロトン性イオン液体のイオンビーム化と二次イオン質量分析(SIMS)の高感度化2015

    • Author(s)
      藤原幸雄、齋藤直昭
    • Organizer
      第6 回イオン液体討論会
    • Place of Presentation
      同志社大学(京都府)
    • Year and Date
      2015-10-27
    • Related Report
      2015 Annual Research Report
  • [Presentation] クラスターイオンビームの二次イオン質量分析(SIMS)への応用2015

    • Author(s)
      藤原幸雄、齋藤直昭
    • Organizer
      学術振興会第132委員会(荷電粒子ビームの工業への応用)第217回研究会
    • Place of Presentation
      東京理科大学(東京都)
    • Year and Date
      2015-10-02
    • Related Report
      2015 Annual Research Report
    • Invited
  • [Presentation] Development of a vacuum-electrospray beam source using a proton-conducting ionic liquid [dema][TfO]: enhancing effect of protonated organic molecules2015

    • Author(s)
      Y. Fujiwara, N. Saito
    • Organizer
      The 20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)
    • Place of Presentation
      The Westin Seattle、シアトル、米国
    • Year and Date
      2015-09-15
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] イオン液体ビーム照射による有機系試料の二次イオン質量分析(SIMS)2015

    • Author(s)
      藤原幸雄、齋藤直昭
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス(神奈川県平塚市)
    • Year and Date
      2015-03-14
    • Related Report
      2014 Research-status Report
  • [Presentation] A new primary ion beam source for Secondary Ion Mass Spectrometry (SIMS) using vacuum electrospray of ionic liquids2014

    • Author(s)
      Yukio Fujiwara, Naoaki Saito
    • Organizer
      The 20th International Mass Spectrometry Conference
    • Place of Presentation
      ジュネーブ国際会議場(スイス)
    • Year and Date
      2014-08-25
    • Related Report
      2014 Research-status Report
  • [Presentation] 真空エレクトロスプレーを用いた二次イオン質量分析(SIMS)用イオン液体ビーム源の開発2014

    • Author(s)
      藤原幸雄、齋藤直昭
    • Organizer
      第62回質量分析総合討論会
    • Place of Presentation
      ホテル阪急エキスポパーク(大阪府吹田市)
    • Year and Date
      2014-05-14
    • Related Report
      2014 Research-status Report
  • [Presentation] 真空エレクトロスプレーを用いたイオン液体ビーム源の開発と二次イオン質量分析(SIMS)への応用

    • Author(s)
      藤原幸雄、齋藤直昭
    • Organizer
      第61回質量分析総合討論会
    • Place of Presentation
      つくば国際会議場(茨城県つくば市)
    • Related Report
      2013 Research-status Report
  • [Presentation] Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS)

    • Author(s)
      Yukio Fujiwara, Naoaki Saito
    • Organizer
      12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12)
    • Place of Presentation
      国際会議場(茨城県つくば市)
    • Related Report
      2013 Research-status Report
  • [Presentation] 真空エレクトロスプレーを用いたSIMS用イオン液体ビーム源の開発

    • Author(s)
      藤原幸雄、齋藤直昭
    • Organizer
      第61回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県相模原市)
    • Related Report
      2013 Research-status Report

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Published: 2014-07-25   Modified: 2019-07-29  

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