Development of a charged-droplet beam source for secondary ion mass spectrometry using ionic liquids

• Project/Area Number: 25410163
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Analytical chemistry
• Research Institution: National Institute of Advanced Industrial Science and Technology
• Principal Investigator: Fujiwara Yukio 国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 (60415742)
• Project Period (FY): 2013-04-01 – 2016-03-31
• Project Status: Completed (Fiscal Year 2015)
• Budget Amount: ¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000); Fiscal Year 2015: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000); Fiscal Year 2014: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000); Fiscal Year 2013: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
• Keywords: 二次イオン / SIMS / イオン源 / イオンビーム / イオン液体 / エレクトロスプレー / クラスター / 帯電液滴 / 表面分析 / 二次イオン質量分析 / ビーム / プロトン付加

Outline of Final Research Achievements

To develop an ion source capable of producing a charged-droplet beam for secondary ion mass spectrometry (SIMS), vacuum electrospray of ionic liquids was investigated. A time-of-flight (TOF) SIMS system was then developed using a vacuum-electrospay primary beam source that is capable of producing a continuous ion beam of an ionic liquid. A primary ion beam of an imidazolium ionic liquid was irradiated to analyze organic samples using the TOF-SIMS system. Obtained secondary ion mass spectra demonstrated that the vacuum electrospray of the ionic liquid was applicable to a primary ion beam source for SIMS.

Research Products

• [Journal Article] Effects of a proton-conducting ionic liquid on secondary ion formation in time-of-flight secondary ion mass spectrometry (2016)
  • Author(s): Y. Fujiwara, N. Saito
  • Journal Title: Rapid Commun. Mass Spectrom. Volume: 30 Issue: 1 Pages: 239-249
  • DOI: 10.1002/rcm.7439
  • Peer Reviewed
• [Journal Article] Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate (2015)
  • Author(s): Y. Fujiwara, N. Saito
  • Journal Title: Applied Physics Express Volume: 8 Issue: 7 Pages: 076601-076601
  • DOI: 10.7567/apex.8.076601
  • NAID: 210000137595
  • Peer Reviewed
• [Journal Article] Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) using an ionic-liquid primary ion beam source (2014)
  • Author(s): Ｙｕｋｉｏ Ｆｕｊｉｗａｒａ, Naoaki Saito
  • Journal Title: Surface and Interface Analysis Volume: 46 Issue: S1 Pages: 348-352
  • DOI: 10.1002/sia.5662
  • Peer Reviewed
• [Journal Article] Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS) (2014)
  • Author(s): Yukio Fujiwara, Naoaki Saito
  • Journal Title: e-Journal of Surface Science and Nanotechnology Volume: 12 Issue: 0 Pages: 119-123
  • DOI: 10.1380/ejssnt.2014.119
  • NAID: 130004933808
  • ISSN: 1348-0391
  • Peer Reviewed
• [Presentation] プロトン性イオン液体のイオンビーム化と二次イオン質量分析（SIMS）の高感度化 (2015)
  • Author(s): 藤原幸雄、齋藤直昭
  • Organizer: 第6 回イオン液体討論会
  • Place of Presentation: 同志社大学（京都府）
  • Year and Date: 2015-10-27
• [Presentation] クラスターイオンビームの二次イオン質量分析（SIMS）への応用 (2015)
  • Author(s): 藤原幸雄、齋藤直昭
  • Organizer: 学術振興会第132委員会（荷電粒子ビームの工業への応用）第217回研究会
  • Place of Presentation: 東京理科大学（東京都）
  • Year and Date: 2015-10-02
  • Invited
• [Presentation] Development of a vacuum-electrospray beam source using a proton-conducting ionic liquid [dema][TfO]: enhancing effect of protonated organic molecules (2015)
  • Author(s): Y. Fujiwara, N. Saito
  • Organizer: The 20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)
  • Place of Presentation: The Westin Seattle、シアトル、米国
  • Year and Date: 2015-09-15
  • Int'l Joint Research
• [Presentation] イオン液体ビーム照射による有機系試料の二次イオン質量分析(SIMS) (2015)
  • Author(s): 藤原幸雄、齋藤直昭
  • Organizer: 第62回応用物理学会春季学術講演会
  • Place of Presentation: 東海大学湘南キャンパス（神奈川県平塚市）
  • Year and Date: 2015-03-14
• [Presentation] A new primary ion beam source for Secondary Ion Mass Spectrometry (SIMS) using vacuum electrospray of ionic liquids (2014)
  • Author(s): Yukio Fujiwara, Naoaki Saito
  • Organizer: The 20th International Mass Spectrometry Conference
  • Place of Presentation: ジュネーブ国際会議場（スイス）
  • Year and Date: 2014-08-25
• [Presentation] 真空エレクトロスプレーを用いた二次イオン質量分析（SIMS）用イオン液体ビーム源の開発 (2014)
  • Author(s): 藤原幸雄、齋藤直昭
  • Organizer: 第62回質量分析総合討論会
  • Place of Presentation: ホテル阪急エキスポパーク（大阪府吹田市）
  • Year and Date: 2014-05-14
• [Presentation] 真空エレクトロスプレーを用いたイオン液体ビーム源の開発と二次イオン質量分析（ＳＩＭＳ）への応用
  • Author(s): 藤原幸雄、齋藤直昭
  • Organizer: 第61回質量分析総合討論会
  • Place of Presentation: つくば国際会議場（茨城県つくば市）
• [Presentation] Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS)
  • Author(s): Yukio Fujiwara, Naoaki Saito
  • Organizer: 12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12)
  • Place of Presentation: 国際会議場（茨城県つくば市）
• [Presentation] 真空エレクトロスプレーを用いたSIMS用イオン液体ビーム源の開発
  • Author(s): 藤原幸雄、齋藤直昭
  • Organizer: 第61回応用物理学会春季学術講演会
  • Place of Presentation: 青山学院大学相模原キャンパス(神奈川県相模原市)