IDENTIFICATION OF GOVERNING PARAMETER AND RELIABILITY EVALUATION FOR CARBON-NANOTUBE DAMAGE UNDER HI-DENSITY ELECTRONIC CURRENT
| Project/Area Number |
25420002
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Materials/Mechanics of materials
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| Research Institution | Hirosaki University |
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Principal Investigator |
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| Co-Investigator(Kenkyū-buntansha) |
MURAOKA Mikio 秋田大学, 大学院理工学研究科, 教授 (50190872)
JU Yang 名古屋大学, 大学院工学研究科, 教授 (60312609)
FUJISAKI Kazuhiro 弘前大学, 大学院理工学研究科, 准教授 (90435678)
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| Project Period (FY) |
2013-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2015: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2014: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2013: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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| Keywords | カーボンナノチューブ / エレクトロマイグレーション / 電子パッケージ / 信頼性 |
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| Outline of Final Research Achievements |
We successfully achieved the fabrication of not only the current loading specimen with several carbon nanotubes (CNTs) but also the CNT-networked specimen, which has large expectation for application to electronic devices in near future. The damages due to evaporation and electromigration of carbon atoms were observed in the CNT-networked specimen and it was found that the dominance of the damage mechanisms depended on operating condition.
We were able to predict the failure location depending on operating condition by means of numerical simulation using a parameter formula governing CNT damage. Furthermore, a simplified method of reliability evaluation for electromigration damage was developed considering usage environment, that is line shape and passivation thickness.
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Report
(4 results)
Research Products
(24 results)
