| Project/Area Number |
25600094
|
|---|
| Research Category |
Grant-in-Aid for Challenging Exploratory Research
|
| Allocation Type | Multi-year Fund |
|---|
| Research Field |
Thin film/Surface and interfacial physical properties
|
|---|
| Research Institution | The University of Tokyo |
|---|
Principal Investigator |
YOSHINOBU Jun 東京大学, 物性研究所, 教授 (50202403)
|
|---|
| Co-Investigator(Renkei-kenkyūsha) |
YOSHIMOTO Shinya 東京大学, 物性研究所, 助教 (90507831)
|
|---|
| Project Period (FY) |
2013-04-01 – 2015-03-31
|
| Project Status |
Completed (Fiscal Year 2014)
|
| Budget Amount *help |
¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2014: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2013: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
|
|---|
| Keywords | 薄膜 / 電気伝導 / 局所プローブ / 有機分子 / 非破壊 / 有機薄膜 / 四探針測定 / 液体金属 / 表面電気伝導 / アマルガム / 探針 |
|---|
| Outline of Final Research Achievements |
We have developed a novel non-destructive liquid-metal coated four-probe surface conductivity measurement system. Electrochemically etched Au wires (0.25 mm diameter) are used as the probes whose surfaces are coated with Hg.The present experimental results show that the thickness of a liquid metal layer on the probe is at least ~3 μm. This non-destructive four-probe surface conductivity measurement system is suitable for the investigation of local conductivity of organic monolayers and organic semiconductor thin films.
|
