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STRUCTURAL TUNING OF NANOGAPS USING FIELD-EMISSION-INDUCED ELECTROMIGRATION

Research Project

Project/Area Number 25630122
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeMulti-year Fund
Research Field Electronic materials/Electric materials
Research InstitutionTokyo University of Agriculture and Technology

Principal Investigator

SHIRAKASHI JUN-ICHI  東京農工大学, 工学(系)研究科(研究院), 准教授 (00315657)

Project Period (FY) 2013-04-01 – 2015-03-31
Project Status Completed (Fiscal Year 2014)
Budget Amount *help
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2014: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
Fiscal Year 2013: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Keywordsナノ構造形成・制御 / ナノギャップ / エレクトロマイグレーション / 電気・電子材料 / FPGA / 単電子トランジスタ / 電子・電気材料 / マイグレーション / 単電子素子
Outline of Final Research Achievements

We propose a simple and easy fabrication scheme of ferromagnetic single-electron transistors (FMSETs), nanogap based resistive switches, and quantum point contacts (QPCs) composed of nanogaps at room temperature. This scheme is based on electromigration induced by a field emission current, which is so-called “activation”. Using the activation method, the electrical properties of Ni nanogaps can be controlled by only adjusting the magnitude of the applied current during the activation process. The conductance of the nanogap changed in quantized steps of 0.5 G0 (G0 = 2e2/h) at the final stage of activation. It is suggested that few-atom Ni contacts are achieved using Ni nanogaps controlled by the activation with precisely tuned applied current. The results clearly indicate that the activation procedure allows us to easily and simply fabricate planar-type nano-scale devices based on Ni nanogaps.

Report

(3 results)
  • 2014 Annual Research Report   Final Research Report ( PDF )
  • 2013 Research-status Report
  • Research Products

    (14 results)

All 2015 2014 2013 Other

All Journal Article (6 results) (of which Peer Reviewed: 4 results,  Acknowledgement Compliant: 1 results,  Open Access: 1 results) Presentation (6 results) Remarks (2 results)

  • [Journal Article] Controlling the tunnel resistance of suspended Ni nanogaps using field-emission-induced electromigration2015

    • Author(s)
      T.:Toyonaka, K. Morihara, K. Takikawa, M. Ito, and J. Shirakashi
    • Journal Title

      J. Vac. Sci. & Technol.

      Volume: 33 Issue: 2

    • DOI

      10.1116/1.4904731

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Structural Tuning of Nanogaps Using Field-Emission-Induced Electromigration with Bipolar Biasing2014

    • Author(s)
      M. Yagi, M. Ito and J. Shirakashi
    • Journal Title

      Conference Proceedings, 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

      Volume: INSPEC Accession #: 14983607 Pages: 134-138

    • DOI

      10.1109/3m-nano.2014.7057332

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Simultaneous Fabrication of Nanogaps Using Field-Emission-Induced Electromigration2014

    • Author(s)
      M. Ito, M. Yagi, K. Morihara and J. Shirakashi
    • Journal Title

      Conference Proceedings, 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

      Volume: INSPEC Accession #: 14983576 Pages: 312-315

    • DOI

      10.1109/3m-nano.2014.7057331

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] ナノギャップでの原子のマイグレーション現象により作製したNi系ナノスケールデバイス2014

    • Author(s)
      須田隆太郎、伊藤光樹、森原康平、豊中貴大、滝川主喜、白樫淳一
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 113 Pages: 95-100

    • Related Report
      2013 Research-status Report
  • [Journal Article] FPGAを用いた超高速フィードバック制御型エレクトロマイグレーション2014

    • Author(s)
      金丸祐真、安藤昌澄、齋藤孝成、白樫淳一
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 113 Pages: 83-87

    • Related Report
      2013 Research-status Report
  • [Journal Article] Electro-Deposition of Thin Si and Ge Films Based on Ballistic Hot Electron Injection2014

    • Author(s)
      N. Koshida, A. Kojima, T. Ohta, R. Mentek, B. Gelloz, N. Mori, J. Shirakashi
    • Journal Title

      ECS Solid State Letters

      Volume: 3 (5) Issue: 5 Pages: P57-P60

    • DOI

      10.1149/2.002405ssl

    • Related Report
      2013 Research-status Report
    • Peer Reviewed / Open Access
  • [Presentation] Ultra-Fast Feedback-Controlled Electromigration Using FPGA2014

    • Author(s)
      Y. Kanamaru, M. Ando, R. Suda and J. Shirakashi
    • Organizer
      2014 International Conference on Nanoscience + Technology (ICN+T 2014)
    • Place of Presentation
      Vail, Colorado, USA.
    • Year and Date
      2014-07-20 – 2014-07-25
    • Related Report
      2014 Annual Research Report
  • [Presentation] Fabrication of Resistive Switching Devices Based on Ni Nanogaps Using Field-Emission-Induced Electromigration2014

    • Author(s)
      K. Takikawa, R. Suda, M. Ito, T. Toyonaka and J. Shirakashi
    • Organizer
      2014 International Conference on Nanoscience + Technology (ICN+T 2014)
    • Place of Presentation
      Vail, Colorado, USA.
    • Year and Date
      2014-07-20 – 2014-07-25
    • Related Report
      2014 Annual Research Report
  • [Presentation] Control of Tunnel Resistance of Suspended Ni Nanogaps Using Field-Emission-Induced Electromigration2014

    • Author(s)
      T. Toyonaka, R. Suda, M. Ito, K. Takikawa and J. Shirakashi
    • Organizer
      2014 International Conference on Nanoscience + Technology (ICN+T 2014)
    • Place of Presentation
      Vail, Colorado, USA.
    • Year and Date
      2014-07-20 – 2014-07-25
    • Related Report
      2014 Annual Research Report
  • [Presentation] ナノギャップでの原子のマイグレーション現象により作製したNi系ナノスケールデバイス2014

    • Author(s)
      須田隆太郎、伊藤光樹、森原康平、豊中貴大、滝川主喜、白樫淳一
    • Organizer
      電子情報通信学会 電子デバイス研究会(ED)/シリコン材料・デバイス研究会(SDM)「機能ナノデバイスおよび関連技術」
    • Place of Presentation
      北海道大学
    • Related Report
      2013 Research-status Report
  • [Presentation] FPGAを用いた超高速フィードバック制御型エレクトロマイグレーション2014

    • Author(s)
      金丸祐真、安藤昌澄、齋藤孝成、白樫淳一
    • Organizer
      電子情報通信学会 電子デバイス研究会(ED)/シリコン材料・デバイス研究会(SDM)「機能ナノデバイスおよび関連技術」
    • Place of Presentation
      北海道大学
    • Related Report
      2013 Research-status Report
  • [Presentation] tic Electro-Deposition of Thin Si, Ge, and SiGe Films2013

    • Author(s)
      R. Suda, M. Ito, M. Yagi, A. Kojima, R. Mentek, N. Mori, J. Shirakashi and N. Koshida
    • Organizer
      2013 International Conference on Solid State Devices and Materials (SSDM 2013)
    • Place of Presentation
      Fukuoka, Japan
    • Related Report
      2013 Research-status Report
  • [Remarks] 白樫研究室ホームページ

    • URL

      http://www.tuat.ac.jp/~nanotech/index.htm

    • Related Report
      2014 Annual Research Report
  • [Remarks] 白樫研究室ホームページ

    • URL

      http://www.tuat.ac.jp/̃nanotech/index.htm

    • Related Report
      2013 Research-status Report

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Published: 2014-07-25   Modified: 2019-07-29  

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