| Budget Amount *help |
¥24,830,000 (Direct Cost: ¥19,100,000、Indirect Cost: ¥5,730,000)
Fiscal Year 2016: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2015: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2014: ¥8,710,000 (Direct Cost: ¥6,700,000、Indirect Cost: ¥2,010,000)
Fiscal Year 2013: ¥11,830,000 (Direct Cost: ¥9,100,000、Indirect Cost: ¥2,730,000)
|
|---|
| Outline of Final Research Achievements |
By using electric-field-induced optical second-harmonic generation (EFISHG) measurement, an experimental method for directly visualizing trapped carrier in organic light-emitting diodes was investigated. For real space visualization, we freshly developed axially polarized EFISHG microscope and CCD imaging-type EFISHG system. These systems allow one to visualize carrier behaviors in milli- to micro-meter area. Results showed carrier behaviors leading to degradation phenomena such as electrical breakdown, 1: voltage dependent carrier trapping, 2: time-dependent pulse-like carrier injection, and 3: development of inhomogeneous carrier distribution. The energy states of carrier traps were analyzed by means of optical excitation, thermal excitation, and electroluminescence.
|
