Multi-modal multi-scale X-ray imaging complementary using synchrotron X-rays and free electron lasers
Project/Area Number |
25709057
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Research Category |
Grant-in-Aid for Young Scientists (A)
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Allocation Type | Partial Multi-year Fund |
Research Field |
Physical properties of metals/Metal-base materials
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Research Institution | Osaka University |
Principal Investigator |
Takahashi Yukio 大阪大学, 工学(系)研究科(研究院), 准教授 (00415217)
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Project Period (FY) |
2013-04-01 – 2017-03-31
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Project Status |
Completed (Fiscal Year 2016)
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Budget Amount *help |
¥24,440,000 (Direct Cost: ¥18,800,000、Indirect Cost: ¥5,640,000)
Fiscal Year 2016: ¥5,330,000 (Direct Cost: ¥4,100,000、Indirect Cost: ¥1,230,000)
Fiscal Year 2015: ¥6,110,000 (Direct Cost: ¥4,700,000、Indirect Cost: ¥1,410,000)
Fiscal Year 2014: ¥6,110,000 (Direct Cost: ¥4,700,000、Indirect Cost: ¥1,410,000)
Fiscal Year 2013: ¥6,890,000 (Direct Cost: ¥5,300,000、Indirect Cost: ¥1,590,000)
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Keywords | X線イメージング / ナノ材料 / X線自由電子レーザー / 放射光 / 金属物性 / X線 |
Outline of Final Research Achievements |
We developed high-resolution coherent X-ray diffraction imaging techniques using focused hard X-ray free-electron laser pulses at SACLA. We performed the coherent X-ray diffraction imaging analysis of nanoparticles, allowing us to analyze the size distribution of particles as well as the electron density projection of individual particles. We measured 1000 single-shot coherent X-ray diffraction patterns of shape-controlled Ag nanocubes and Au/Ag nanoboxes, and estimated the edge length from the speckle size of the coherent diffraction patterns. We then reconstructed the two-dimensional electron density projection with sub-10-nm resolution from selected coherent diffraction patterns. We established a scheme for the complementary use of XFEL at SACLA and synchrotron X-rays at SPring-8
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Report
(5 results)
Research Products
(24 results)
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[Journal Article] KOTOBUKI-1 apparatus for cryogenic coherent X-ray diffraction imaging2013
Author(s)
M. Nakasako, Y. Takayama, T. Oroguchi, Y. Sekiguchi, A. Kobayashi, K. Shirahama, M. Yamamoto*, T. Hikima, K. Yonekura, S. Maki-Yonekura, Y. Kohmura, Y. Inubushi, Y. Takahashi*, A. Suzuki, S. Matsunaga, Y. Inui, K. Tono, T. Kameshima, Y. Joti, and T. Hoshi
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Journal Title
Review of Scientific Instruments
Volume: 84
Issue: 12
Pages: 93705-16
DOI
Related Report
Peer Reviewed
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