| Project/Area Number |
25790002
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Multi-year Fund |
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| Research Field |
Nanostructural chemistry
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| Research Institution | Tokyo Institute of Technology |
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Principal Investigator |
Fujii Shintaro 東京工業大学, 理工学研究科, 流動研究員 (70422558)
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| Project Period (FY) |
2013-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2014: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2013: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
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| Keywords | グラフェン / 電子物性 / プローブ顕微鏡 / 密度汎関数法 / 化学修飾 / ナノグラフェン / 走査型トンネル顕微鏡 / エッジ状態 / ＤＦＴ / ナノ炭素材料 |
|---|
| Outline of Final Research Achievements |
Chemistry of graphene edges significantly affects their electronic properties. Despite a large number of experimental and theoretical studies dealing with the geometrical shape-dependent electronic properties of graphene edges, experimental characterization of their chemistry is clearly lacking. This is mostly due to the difficulties in preparing chemically-modified graphene edges in a controlled manner and in identifying the exact chemistry of the graphene edge on the atomic scale. In this study, we performed scanning probe microscopic and first-principles characterization of graphene edges with different edge geometries and chemistry. Using the results of atomic scale electronic characterization and theoretical simulation, we revealed that atomic-scale details of the chemical composition have a strong impact on the electronic properties of graphene edges, i.e., the presence or absence of non-bonding π states and the degree of resonance stability.
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