Development of nondestructive evaluation technique of electronic states of thin-film solar cells by soft X-ray emission spectroscopy
Project/Area Number |
25790060
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Research Category |
Grant-in-Aid for Young Scientists (B)
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Allocation Type | Multi-year Fund |
Research Field |
Thin film/Surface and interfacial physical properties
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Research Institution | Japan Atomic Energy Agency |
Principal Investigator |
IMAZONO Takashi 独立行政法人日本原子力研究開発機構, 原子力科学研究部門 量子ビーム応用研究センター, 研究副主幹 (50370359)
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Project Period (FY) |
2013-04-01 – 2015-03-31
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Project Status |
Completed (Fiscal Year 2014)
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Budget Amount *help |
¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
Fiscal Year 2014: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2013: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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Keywords | 軟X線発光分光 / 多層膜回折格子 / 電子状態分析 / 薄膜太陽電池 / 化学結合状態 / 軟X線多層膜 |
Outline of Final Research Achievements |
The purpose of this study is to develop nondestructive technique for electronic state analysis of the absorbers in thin-film CIS solar cells by soft X-ray emission spectroscopy. In order to detect simultaneously the L emission lines of Cu, In and Se in the soft X-ray region of 1-3.5 keV, an aperiodic Ni/C multilayer film was invented and deposited onto a laminar-type diffraction grating by an ion-beam sputtering method. The optical property was characterized by synchrotron radiation. As the result, it has been verified experimentally that the new aperiodic layer structure is effective for expanding the bandwidth of the diffraction efficiency of the multilayer grating. This means that a wideband soft X-ray emission spectrometer has been developed successfully.
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Report
(3 results)
Research Products
(36 results)
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[Journal Article] Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry2014
Author(s)
M. Terauchi, S. Koshiya, F. Satoh, H. Takahashi, N. Handa, T. Murano, M. Koike, T. Imazono, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, and S. Kuramoto
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Journal Title
Microscopy and Microanalysis
Volume: 20
Issue: 3
Pages: 692-697
DOI
Related Report
Peer Reviewed
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[Journal Article] Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes2014
Author(s)
H. Takahashi, T. Murano, M. Takakura, N. Handa, M. Terauchi, M. Koike, T. Kawachi, T. Imazono, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, and S. Kuramoto
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Journal Title
JEOL News
Volume: 49
Pages: 73-80
Related Report
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[Journal Article] Development of an objective flat-field spectrograph for electron microscopic soft x-ray emission spectrometry in 50-4000 eV2013
Author(s)
Takashi Imazono, Masato Koike, Tetsuya Kawachi, Noboru Hasegawa, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto, Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano
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Journal Title
Proceedings of SPIE
Volume: 8848
Pages: 88481201-14
DOI
Related Report
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[Presentation] Enhancement of diffraction efficiency of laminar-type diffraction gratings overcoated with diamond-like carbon (DLC) in soft X-ray region2015
Author(s)
M. Koike, T. Imazono, T Nagano, H. Sasai, Y. Oue, S. Kuramoto, M. Terauchi, H. Takahashi, T. Notoya, and T. Murano
Organizer
12th International Conference on Synchrotron Radiation Instrumentation (SRI2015)
Place of Presentation
New York, USA
Year and Date
2015-07-06 – 2015-07-10
Related Report
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[Presentation] Experimental evaluation of a method to enhance the diffraction efficiency by overcoating diamond-like carbon (DLC) on soft X-ray laminar-type gratings2015
Author(s)
T. Imazono, M. Koike, T Nagano, H. Sasai, Y. Oue, S. Kuramoto, M. Terauchi, H. Takahashi, T. Notoya, and T. Murano
Organizer
12th International Conference on Synchrotron Radiation Instrumentation (SRI2015)
Place of Presentation
New York, USA
Year and Date
2015-07-06
Related Report
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[Presentation] EM用軟X線発光分析技術開発のこれまでと今後の展望2014
Author(s)
寺内正己, 高橋秀之, 飯田信雄, 村野孝訓, 小池雅人, 今園孝志, 小枝勝, 長野哲也, 笹井浩行, 大上裕紀, 米澤善央, 倉本智史
Organizer
日本顕微鏡学会第56回九州支部学術講演会
Place of Presentation
宮崎市民プラザ, 宮崎市
Year and Date
2014-12-06
Related Report
Invited
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[Presentation] Chemical state information of bulk materials obtained by SEM-based SXES grating spectrometer2014
Author(s)
M. Terauchi, S. Koshiya, F. Satoh, H. Takahashi, T. Notoya, T. Murano, M. Koike, T. Imazono, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto
Organizer
第15回光量子科学研究シンポジウム
Place of Presentation
日本原子力研究開発機構, 木津川市
Year and Date
2014-11-13 – 2014-11-14
Related Report
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[Presentation] リチウムK発光高感度分光計測のための軟X線高効率回折格子の設計2014
Author(s)
小池雅人, 今園孝志, 小枝勝, 長野哲也, 笹井浩行, 大上裕紀, 米澤善央, 倉本智史, 寺内正己, 高橋秀之, 飯田信雄, 村野孝訓
Organizer
第50回X線分析討論会
Place of Presentation
東北大学片平さくらホール, 仙台市
Year and Date
2014-10-30 – 2014-10-31
Related Report
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[Presentation] Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials2014
Author(s)
M. Terauchi, H. Takahashi, N. Handa, T. Murano, M. Koike, T. Imazono, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, and S. Kuramoto
Organizer
Microscopy & Microanalysis
Place of Presentation
Hartford, USA
Year and Date
2014-08-03 – 2014-08-07
Related Report
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[Presentation] 電子顕微鏡用平面結像型軟X線回折格子発光分光器の開発とその性能2014
Author(s)
今園孝志, 小池雅人, 小枝勝, 長野哲也, 笹井浩行, 大上裕紀, 米澤善央, 倉本智史, 寺内正己, 高橋秀之, 飯田信雄, 村野孝訓
Organizer
2014年度立命館大学SRセンター研究成果報告会
Place of Presentation
立命館大学, 草津市
Year and Date
2014-06-07
Related Report
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[Presentation] 電子顕微鏡用軟X線分光器の開発と応用2014
Author(s)
高橋秀之, 飯田信雄, 村野孝訓, 寺内正己, 小池雅人, 今園孝志, 長谷川登, 小枝勝, 長野哲也, 笹井浩行, 大上裕紀, 米澤善央, 倉本智史
Organizer
第30回分析電子顕微鏡討論会
Place of Presentation
幕張メッセ国際会議場, 千葉市
Year and Date
2014-05-12
Related Report
Invited
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[Presentation] 電子顕微鏡用SXES技術の現状と今後の展望2014
Author(s)
寺内正己, 高橋秀之, 飯田信雄, 村野孝訓, 小池雅人, 今園孝志, 小枝勝, 長野哲也, 笹井浩行, 大上裕紀, 米澤善央, 倉本智史
Organizer
日本顕微鏡学会第70回学術講演会
Place of Presentation
幕張メッセ国際会議場, 千葉市
Year and Date
2014-05-11 – 2014-05-13
Related Report
Invited
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[Presentation] EPMA/SEM軟X線分光法による化学結合効果の各種情報観察2014
Author(s)
高橋秀之, 村野孝訓, 飯田信雄, 寺内正己, 小池雅人, 今園孝志, 長谷川登, 小枝勝, 長野哲也, 笹井浩行, 大上裕紀, 米澤善央, 倉本智史
Organizer
日本顕微鏡学会第70回記念学術講演会
Place of Presentation
幕張メッセ国際会議場, 千葉市
Year and Date
2014-05-11 – 2014-05-13
Related Report
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[Presentation] Development of an objective flat-field spectrograph for electron microscopic soft x-ray emission spectrometry in 50-4000 eV
Author(s)
Takashi Imazono, Masato Koike, Tetsuya Kawachi, Noboru Hasegawa, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto, Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano
Organizer
SPIE Optics + Photonics
Place of Presentation
San Diego Convention Center, San Diego, CA, USA
Related Report
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[Presentation] Wide band soft x-ray grating spectrographs in the 50-4000 eV range and their application to electron microscopes
Author(s)
Takashi Imazono, Masato Koike, Tetsuya Kawachi, Noboru Hasegawa, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto, Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano
Organizer
12th Symposium on X-ray Imaging Optics
Place of Presentation
大阪大学中ノ島センター、大阪市
Related Report
Invited
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