Development of supression method of nonlinearity and its wavelength dependence for optical sensor
Project/Area Number |
25790077
|
Research Category |
Grant-in-Aid for Young Scientists (B)
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Allocation Type | Multi-year Fund |
Research Field |
General applied physics
|
Research Institution | National Institute of Advanced Industrial Science and Technology |
Principal Investigator |
Minoru Tanabe 国立研究開発法人産業技術総合研究所, 物理計測標準研究部門, 研究員 (80586339)
|
Project Period (FY) |
2013-04-01 – 2016-03-31
|
Project Status |
Completed (Fiscal Year 2015)
|
Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2014: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2013: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
|
Keywords | 光センサ / 光計測 / シリコンフォトダイード / 応答非直線性 / レーザ / 計測工学 / 光物性 |
Outline of Final Research Achievements |
Nonlinearity measurement system for optical sensor with optical flux addition has been developed. Spectral nonlinearity of silicon photodiodes in the range from visible light to near-infrared light was measured with the developed system. Comparing theses experimentally measured results with theoretical models including the photocurrent generated in the Si bulk, the model enables us to quantitatively explain the starting power level and wavelength of the nonlinearity for a silicon photodiode. These comparison results contribute the suppression of nonlinearity generation for a silicon photodiode and the precise optical evaluations over wide optical power ranges and various incident wavelengths.
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Report
(4 results)
Research Products
(13 results)