| Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2014: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2013: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
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| Outline of Final Research Achievements |
Dynamical surface fluctuation of polymer thin films relating to dewetting phenomena were studied by grazing incidence X-ray photon correlation spectroscopy. The dynamical fluctuation of dewetting phenomena is known to be deep relation with the critical phenomena. In this study, the surface fluctuation of polyhedral oligomeric silsesquioxane functionalized polysytrene (PS-POSS) thin films were studied since the introduction of POSS as a polystyrene (PS) end-functionalization group was reported to prohibit the PS thin films from dewetting. The constraint dynamical fluctuation of the PS-POSS thin films compared to homo-PS thin films were successfully observed, and the presence of high viscosity layer at the top of the film and decrease of surface tension were indicated.
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