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Fabrication of high-quality substrates for nitride-semiconductor-based solar cells

Research Project

Project/Area Number 25820120
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Electronic materials/Electric materials
Research InstitutionThe University of Tokyo

Principal Investigator

KOBAYASHI Atsushi  東京大学, 生産技術研究所, 特任助教 (20470114)

Project Period (FY) 2013-04-01 – 2015-03-31
Project Status Completed (Fiscal Year 2014)
Budget Amount *help
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2014: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2013: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
Keywords窒化物半導体 / 薄膜成長 / 電子・電気材料
Outline of Final Research Achievements

We have fabricated novel substrates for high-performance nitride semiconductor solar cells. The substrates were fabricated via peeling off the high-quality nitride films epitaxially grown on lattice-matched oxide substrates. This process has enabled the fabrication of nitride semiconductor templates with arbitrary lattice constants and band-gaps.

Report

(3 results)
  • 2014 Annual Research Report   Final Research Report ( PDF )
  • 2013 Research-status Report
  • Research Products

    (14 results)

All 2014 2013 Other

All Journal Article (8 results) (of which Peer Reviewed: 8 results,  Open Access: 1 results) Presentation (4 results) (of which Invited: 2 results) Remarks (2 results)

  • [Journal Article] Structural properties of GaN films grown on multilayer graphene films by pulsed sputtering2014

    • Author(s)
      J. W. Shon, J. Ohta, K. Ueno, A. Kobayashi, and H. Fujioka
    • Journal Title

      Applied Physics Express

      Volume: 7 Issue: 8 Pages: 085502-085502

    • DOI

      10.7567/apex.7.085502

    • NAID

      210000137197

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Fabrication of full-color InGaN-based light-emitting diodes on amorphous substrates by pulsed sputtering2014

    • Author(s)
      J. W. Shon, J. Ohta, K. Ueno, A. Kobayashi, and H. Fujioka
    • Journal Title

      Scientific Reports

      Volume: 4 Issue: 1 Pages: 5325-5325

    • DOI

      10.1038/srep05325

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] AlGaN/GaN heterostructure prepared on a Si (110) substrate via pulsed sputtering2014

    • Author(s)
      T. Watanabe, J. Ohta, T. Kondo, M. Ohashi, K. Ueno, A. Kobayashi, and H. Fujioka
    • Journal Title

      Applied Physics Letters

      Volume: 104 Issue: 18 Pages: 182111-182111

    • DOI

      10.1063/1.4876449

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Theoretical study of InN growth on Mn-stabilized zirconia (111) substrates2014

    • Author(s)
      Y. Guo, S. Inoue, A. Kobayashi, J. Ohta, and H. Fujioka
    • Journal Title

      Thin Solid Films

      Volume: 551 Pages: 110-113

    • DOI

      10.1016/j.tsf.2013.11.100

    • Related Report
      2013 Research-status Report
    • Peer Reviewed
  • [Journal Article] Field-effect transistors based on cubic indium nitride2014

    • Author(s)
      M. Oseki, K. Okubo, A. Kobayashi, J. Ohta, and H. Fujioka
    • Journal Title

      Scientific Reports

      Volume: 4 Issue: 1 Pages: 3951-3951

    • DOI

      10.1038/srep03951

    • Related Report
      2013 Research-status Report
    • Peer Reviewed
  • [Journal Article] Solid-phase epitaxy of InOxNy alloys via thermal oxidation of InN films on yttria-stabilized zirconia2014

    • Author(s)
      A. Kobayashi, T. Itoh, J. Ohta, M. Oshima, and H. Fujioka
    • Journal Title

      Physica Status Solidi RRL

      Volume: Early View Issue: 4 Pages: 362-366

    • DOI

      10.1002/pssr.201400007

    • Related Report
      2013 Research-status Report
    • Peer Reviewed
  • [Journal Article] Electrical properties of amorphous-Al2O3/single-crystal ZnO heterointerfaces2013

    • Author(s)
      J. Liu, A. Kobayashi, J. Ohta, H. Fujioka, and M. Oshima
    • Journal Title

      Applied Physics Letters

      Volume: 103 Issue: 17 Pages: 172101-172101

    • DOI

      10.1063/1.4826538

    • Related Report
      2013 Research-status Report
    • Peer Reviewed
  • [Journal Article] Atomic scattering spectroscopy for determination of the polarity of semipolar AlN grown on ZnO2013

    • Author(s)
      A. Kobayashi, K. Ueno, J. Ohta, M. Oshima, and H. Fujioka
    • Journal Title

      Applied Physics Letters

      Volume: 103 Issue: 19 Pages: 192111-192111

    • DOI

      10.1063/1.4829478

    • Related Report
      2013 Research-status Report
    • Peer Reviewed
  • [Presentation] 酸化亜鉛基板上への窒化物半導体低温成長2014

    • Author(s)
      小林篤,太田実雄,藤岡洋
    • Organizer
      第6回窒化物半導体結晶成長講演会
    • Place of Presentation
      名城大学
    • Year and Date
      2014-07-26
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] YSZ 基板上に成長した(InN)x(In2O3)1-x薄膜の特性

    • Author(s)
      小林篤,伊藤剛輝,太田実雄,尾嶋正治,藤岡洋
    • Organizer
      第32回電子材料シンポジウム
    • Place of Presentation
      ラフォーレ琵琶湖
    • Related Report
      2013 Research-status Report
  • [Presentation] Low-temperature epitaxial growth of non/semi-polar group-III nitrides on ZnO

    • Author(s)
      Atsushi Kobayashi, Tomofumi Kajima, Hiroaki Tamaki, Jituso Ohta, Masaharu Oshima, and Hiroshi Fujioka
    • Organizer
      2013 JSAP-MRS Joint Symposium
    • Place of Presentation
      同志社大学
    • Related Report
      2013 Research-status Report
    • Invited
  • [Presentation] 酸化亜鉛基板上窒化物半導体の格子歪みと偏光特性

    • Author(s)
      小林篤,玉木啓晶 ,太田実雄,藤岡洋
    • Organizer
      第61回 応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学
    • Related Report
      2013 Research-status Report
  • [Remarks]

    • URL

      https://sites.google.com/site/akobayashi920/

    • Related Report
      2014 Annual Research Report
  • [Remarks] http://www.iis.u-tokyo.ac.jp/~hfujioka/

    • Related Report
      2014 Annual Research Report

URL: 

Published: 2014-07-25   Modified: 2019-07-29  

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