Study of diamond thin film as a beam exit window to the atmosphere for high energy ions and a position-sensitivity detector
Project/Area Number |
26249149
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Research Category |
Grant-in-Aid for Scientific Research (A)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Nuclear engineering
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Research Institution | Gunma University (2015-2016) Japan Atomic Energy Agency (2014) |
Principal Investigator |
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Co-Investigator(Kenkyū-buntansha) |
鹿田 真一 国立研究開発法人産業技術総合研究所, ユビキタスエネルギー研究部門, 総括研究主幹 (00415689)
加田 渉 群馬大学, 理工学研究院, 助教 (60589117)
大島 武 国立研究開発法人量子科学技術研究開発機構, 高崎量子応用研究所 先端機能材料研究部, 上席研究員(定常) (50354949)
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Co-Investigator(Renkei-kenkyūsha) |
SATOH Takahiro (ONODA Shinobu) 国立研究開発法人量子科学技術研究開発機構, 高崎量子応用研究所 放射線高度利用施設部, 上席研究員 (10370404)
MOKUNO Yoshiaki 国立研究開発法人産業技術総合研究所, 先進パワーエレクトロニクスセンター, チーム長 (60358166)
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Project Period (FY) |
2014-04-01 – 2017-03-31
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Project Status |
Completed (Fiscal Year 2016)
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Budget Amount *help |
¥41,600,000 (Direct Cost: ¥32,000,000、Indirect Cost: ¥9,600,000)
Fiscal Year 2016: ¥8,320,000 (Direct Cost: ¥6,400,000、Indirect Cost: ¥1,920,000)
Fiscal Year 2015: ¥14,300,000 (Direct Cost: ¥11,000,000、Indirect Cost: ¥3,300,000)
Fiscal Year 2014: ¥18,980,000 (Direct Cost: ¥14,600,000、Indirect Cost: ¥4,380,000)
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Keywords | ダイヤモンド検出器 / ダイヤモンド薄膜 / 大気取出し窓兼イオン位置検出器 / 高エネルギーイオン / IBIC / ワイドバンドギャップ / 位置敏感型 / 位置敏感型検出器 / マイクロビーム |
Outline of Final Research Achievements |
As an exit window as well as a transmission position sensitive detector for high energy ions transmitted to atmosphere, a novel membrane device made of single crystal diamond has been developed. A test device was made and the ion-beam-induced charge (IBIC) or the time measured response (QTS) made a comprehensive evaluation. Watching the first IBIC measurement of ion incident position-dependent output signal. In addition and comparison between experimental and calculated deterioration characteristics associated with the increase in signal strength dose, proposed a new degradation parameter. The electrical activity of single crystal diamond semiconductor investigated by QTS. In addition confirmed new phenomenon due to the avalanche effect induced by ion beam generation charge amplifier.
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Report
(4 results)
Research Products
(19 results)
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[Journal Article] Charge multiplication effect in thin diamond films2016
Author(s)
50.N. Skukan, V. Grilj, I. Sudic;, M. Pomorski, W. Kada, T. Makino, Y. Kambayashi, Y. Andoh, S. Onoda, S. Sato, T. Ohshima, T. Kamiya and M. Jaksic;,
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Journal Title
Applied Physics Letters
Volume: 109
Issue: 4
Pages: 043502-043502
DOI
Related Report
Peer Reviewed / Int'l Joint Research / Acknowledgement Compliant
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[Journal Article] Investigation of electrically-active deep levels in single-crystalline diamond by particle-induced charge transient spectroscopy,2016
Author(s)
45.W. Kada, Y. Kambayashi, Y. Ando, S. Onoda, H. Umezawa, Y. Mokuno, S. Shikata, T. Makino, M. Koka, O. Hanaizumi, T. Kamiya, T. Ohshima
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Journal Title
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume: 372
Pages: 151-155
DOI
Related Report
Peer Reviewed / Int'l Joint Research / Acknowledgement Compliant
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[Journal Article] Development of diagnostic method for deep levels in semiconductors using charge induced by heavy ion microbeams2015
Author(s)
41.W. Kada, Y. Kambayashi, N. Iwamoto, S. Onoda, T. Makino, M. Koka, T. Kamiya, N.Hoshino, H. Tsuchida, K. Kojima, O. Hanaizumi, and T. Ohshima
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Journal Title
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume: 348
Pages: 240-245
DOI
Related Report
Peer Reviewed / Acknowledgement Compliant
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[Journal Article] Continuous observation of polarization effects in thin SC-CVD diamond detector designed for heavy ion microbeam measurement2014
Author(s)
W.Kada, N,Iwamoto, T.Satoh, S.Onoda, V.Grilj, N.Skukan, M. Koka, T.Ohshima, M.Jaksic, T.Kamiya,
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Journal Title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume: 331
Pages: 113-116
DOI
Related Report
Peer Reviewed / Open Access
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[Presentation] Transient Current Induced in Thin Film Diamonds by Swift Heavy Ions2016
Author(s)
S-I. Sato, T. Makino, T. Ohshima, T. Kamiya, W. Kada, V. Grilj, N. Skukan, M. Jaksic, M. Pomorski, G. Vizkelethy
Organizer
27th International Conference on Diamond and Carbon Materials
Place of Presentation
Le Corum, Montpellier, France
Year and Date
2016-09-04
Related Report
Int'l Joint Research
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[Presentation] Development of radiation detector based on CVD diamond membrane with embedded living-cell cultivation environment,2016
Author(s)
2.W. Kada, M. Sakai, M. Pomorski, N. Skukan, T. Makino, M. Jaksic;, S. Onoda, T. Ohshima,T. Kamiya, and O. Hanaizumi,
Organizer
The 12th International Workshop on Ionizing Radiation Monitoring(IWIRM)
Place of Presentation
大洗パークホテル
Related Report
Int'l Joint Research
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[Presentation] Investigation of Deep Levels in Diamond based Radiation Detector by Transient Charge Spectroscopy with Focused Heavy Ion Microbeam2015
Author(s)
Y. Ando, Y. Kambayashi, W. Kada, S. Onoda, T. Makino, S. Sato, H. Umezawa, Y. Mokuno, S. Shikata, O. Hanaizumi, T. Kamiya and T. Ohshima
Organizer
2015 International Conference on Solid State Devices and Materials (SSDM2015)
Place of Presentation
札幌コンベンションセンター
Year and Date
2015-09-27
Related Report
Int'l Joint Research
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[Presentation] Study of diamond membrane detector aiming at highly-efficient and position-sensitive particle detection for ion beam applications2015
Author(s)
T. Kamiya, W. Kada, Y. Kambayashi, T. Makino, S. Onoda, T. Ohshima, N.Iwamoto, S. Shikata, Y. Mokuno, H. Umezawa, M. Pomorski, V. Grilj, N.Skukan, and M. Jakšić
Organizer
22nd International Conference on Ion Beam Analysis(IBA2015)
Place of Presentation
Opatija, Croatia
Year and Date
2015-06-14
Related Report
Int'l Joint Research
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[Presentation] Development of Diagnostic Method for Deep Levels in Semiconductors using Charge Induced by Heavy Ion2014
Author(s)
T.OHSHIMA, N. IWAMOTO, M.KOKA,S.ONODA, T. MAKINO, T. KAMIYA, W.KADA, Y.KANBAYASHI, N. HOSHINO, H.TSUCHIDA, K. KOJIMA,
Organizer
14th International Conference on Nuclear Microprobe Technology and Applications
Place of Presentation
イタリア、パドバ、パドバ大学及びサンガエターノ文化センター
Year and Date
2014-07-06 – 2014-07-11
Related Report
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[Presentation] Investigation of Deep Levels in Silicon Carbide using Ion-Induced Charge Transient Spectroscopy2014
Author(s)
W.KADA, S. ONODA, N.IWAMOTO, N.HOSHINO, H.TSUCHIDA, T.MAKINO, Y.KANBAYASHI, O.HANAIZUMI, M. KOKA,T. KAMIYA, T.OHSHIMA,
Organizer
14th International Conference on Nuclear Microprobe Technology and Applications
Place of Presentation
イタリア、パドバ、パドバ大学及びサンガエターノ文化センター
Year and Date
2014-07-06 – 2014-07-11
Related Report