| Budget Amount *help |
¥16,120,000 (Direct Cost: ¥12,400,000、Indirect Cost: ¥3,720,000)
Fiscal Year 2016: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2015: ¥7,410,000 (Direct Cost: ¥5,700,000、Indirect Cost: ¥1,710,000)
Fiscal Year 2014: ¥6,630,000 (Direct Cost: ¥5,100,000、Indirect Cost: ¥1,530,000)
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| Outline of Final Research Achievements |
In order to investigate surface elastic and electronic properties on nanoscale, I invented new physical property detection techniques using atomic force microscopy (AFM) and kelvin prove force microscopy (KPFM). Here I propose a three force component detection method on sub-atomic scale and apply it to Ge(001)-c(4×2) surface using a bimodal AFM. I expressed them as a three-dimensional force vector distribution for the first time. The technique and result are highly evaluated and published in Nature Physics. In addition, I developed 3w-KPFM method to probe electronic distribution on a surface and its changes. I realized simultaneous observation of surface elasticity and surface electronic distribution on a surface at the atomic scale.
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