| Budget Amount *help |
¥17,160,000 (Direct Cost: ¥13,200,000、Indirect Cost: ¥3,960,000)
Fiscal Year 2016: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2015: ¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2014: ¥10,920,000 (Direct Cost: ¥8,400,000、Indirect Cost: ¥2,520,000)
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| Outline of Final Research Achievements |
XRF imaging spectrometer based on wavelength dispersive analysis was developed. The distance between the sample and analyzing crystal was shortened. As a result, the special resolution was improved. Using a new sample stage installed, the large sample area was scanned and analyzed during the WDXRF imaging. Furthermore, a highly sensitive 2D detector was installed for a fast XRF imaging. It was demonstrated that main elements in the bulk sample were imaged in a short time less than 1 s. Using this fast imaging, this technique was applied for imaging the Pb and Cu in the electric devices as well as monitoring the elemental dissolving process of metals in acid solutions.
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