Nano characterization and electronic states analysis by high-speed measurement
| Project/Area Number |
26390004
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Nanostructural chemistry
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| Research Institution | National Institute of Advanced Industrial Science and Technology |
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Principal Investigator |
Koshino Masanori 国立研究開発法人産業技術総合研究所, ナノ材料研究部門, 研究グループ長 (00505240)
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| Project Period (FY) |
2014-04-01 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000)
Fiscal Year 2016: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2015: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2014: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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| Keywords | 電子顕微鏡 / 電子エネルギー損失スペクトル / フラーレン / カーボンナノチューブ / グラフェン / 2次元物質 / 高速測定 / 第一原理計算 / STEM / EELS / 動画 / 単原子 / 単分子 / EDS / ナノチューブ / TEM / 高速 / 高感度 / 分子 |
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| Outline of Final Research Achievements |
The combination of Scanning Transmission Electron Microscopy (STEM) and Electron Energy-Loss Spectroscopy (EELS), that enables to obtain both atomic structures and their electron energy states precisely, plays an very important role in understanding structures and functions of materials properly. The aim of this research is to apply this method to damage-sensitive materials by high-speed, high-sensitive, and damage-free analyses. Systematic studies of (1) the development of image and spectrum acquisition technique, (2) the development of atomic labeling methods, (3) effect of temperature, energy, and other possible environmental factors, and (4) new methods to support materials on ultra-thin substrate or in vacuum for imaging, have been carried out.
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Report
(4 results)
Research Products
(15 results)
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[Presentation] STEM-EELSによる構造および電子状態の解析2015
Author(s)
越野 雅至, Luiz Tizei, Jamie Warner, Ovidiu Cretu, 劉 崢, Lin Yung-Chang, Hee Kwan, 飯泉 陽子, 岡崎 俊也, 末永 和知
Organizer
日本顕微鏡学会第71回学術講演会
Place of Presentation
国立京都国際会館，京都市
Year and Date
2015-05-13
Related Report
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