Photo-detection using a sinusoidally gated silicon avalanche photodiode
Project/Area Number |
26390087
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Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Multi-year Fund |
Section | 一般 |
Research Field |
Optical engineering, Photon science
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Research Institution | Nihon University |
Principal Investigator |
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Project Period (FY) |
2014-04-01 – 2017-03-31
|
Project Status |
Completed (Fiscal Year 2016)
|
Budget Amount *help |
¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000)
Fiscal Year 2016: ¥390,000 (Direct Cost: ¥300,000、Indirect Cost: ¥90,000)
Fiscal Year 2015: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2014: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
|
Keywords | 単一光子検出 / シリコン雪崩フォトダイオード / 単一光子検出器 / シリコンなだれフォトダイオード |
Outline of Final Research Achievements |
In this research, the single-photon detector with a very high detection efficiency using a silicon avalanche photodiode (Si-APD). Si-SPAD was driven by the open-terminated gated passive quenching circuit (OT-GPQC). The OT-GPQC realizes the gate operation of the Si-APD with a reverse bias voltage of 37 V over the breakdown voltage and a gate duration of 4 ns (corresponds to a response time of the Si-SPAD). The very-high-voltage and short gate operation extremely enhanced the avalanche detection probability: the photo-excited carrier grows into detectable macroscopic current, without significant increase of noise counts. Finally the avalanche detection probability of 99% was achieved. The tested Si-APD then has a quantum efficiency of 85.6% at a wavelength of 780 nm. Therefore, the Si-APD operated with the OT-GPQC has had a single-photon detection efficiency of 85.2% with a dark count probability per gate of 10-6.
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Report
(4 results)
Research Products
(9 results)