| Budget Amount *help |
¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000)
Fiscal Year 2016: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2015: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2014: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
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| Outline of Final Research Achievements |
Grazing Incidence X-ray Scattering (GISAXS) method is powerful tool to analyze mesoscpic structures in organic (polymer) thin films. Ordinaly, hard X-rays (1-1.5A) are often used for GISAXS method. In recent, wide ragne of X-ray between 2 to 14 keV has been deveploed and normally available for GISAXS in the Japanese synchrotron facility. Utilizing X-rays near the adorption edge of taget elements revealed spacial distribution of the target elements in thin films. Tender X-rays enebles to analyze tepth-resolved structure in the thin films. We found that different between the nano-structures near the surface and in vicinity of the substrate.
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