Precise Structure Analysis of Multi-Components Origanic Thin Films by Grazing Incidence X-ray Scattering utilizing Wide Energy X-rays
Project/Area Number |
26410132
|
Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Multi-year Fund |
Section | 一般 |
Research Field |
Polymer chemistry
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Research Institution | Nagoya Institute of Technology |
Principal Investigator |
Yamamoto Katsuhiro 名古屋工業大学, 工学(系)研究科(研究院), 准教授 (30314082)
|
Project Period (FY) |
2014-04-01 – 2017-03-31
|
Project Status |
Completed (Fiscal Year 2016)
|
Budget Amount *help |
¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000)
Fiscal Year 2016: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2015: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2014: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
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Keywords | 斜入射小角X線散乱 / 高分子薄膜 / 相分離構造 / テンダーX線 / 異常小角散乱 / ブロック共重合体 / 高分子構造 / 深さ分解 / 低エネルギーX線 / ミクロ相分離構図 / 深さ分解構造解析 / 表面 / 界面 / 微小角入射小角X線散乱 / 薄膜 / ミクロ相分離構造 |
Outline of Final Research Achievements |
Grazing Incidence X-ray Scattering (GISAXS) method is powerful tool to analyze mesoscpic structures in organic (polymer) thin films. Ordinaly, hard X-rays (1-1.5A) are often used for GISAXS method. In recent, wide ragne of X-ray between 2 to 14 keV has been deveploed and normally available for GISAXS in the Japanese synchrotron facility. Utilizing X-rays near the adorption edge of taget elements revealed spacial distribution of the target elements in thin films. Tender X-rays enebles to analyze tepth-resolved structure in the thin films. We found that different between the nano-structures near the surface and in vicinity of the substrate.
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Report
(4 results)
Research Products
(24 results)