X-Ray stress measurements of coarse-grained materials using area detector
Project/Area Number |
26420009
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Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Multi-year Fund |
Section | 一般 |
Research Field |
Materials/Mechanics of materials
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Research Institution | Niigata University |
Principal Investigator |
Suzuki Kenji 新潟大学, 人文社会・教育科学系, 教授 (30154537)
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Project Period (FY) |
2014-04-01 – 2017-03-31
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Project Status |
Completed (Fiscal Year 2016)
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Budget Amount *help |
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2016: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2015: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2014: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
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Keywords | X線応力測定 / 2次元検出器 / 粗大粒 / 二重露光法 / 直接法 / シンプレックス法 / cosα法 / 残留応力 |
Outline of Final Research Achievements |
An X-ray area detector is needed for an X-ray stress measurement of coarse-grained materials, because the X-ray diffraction pattern of coarse grains becomes spotted. In this study, I proposed the “direct-method” using the area detector and the normal incident X-ray to determine the optimum values of stresses. The direct-method uses the simplex method which is a kind of linear programing. The error of the diffraction angles for spotted pattern is caused by the difference between the center of the irradiated area and the center of the grains. As the measure against the problems of the coarse-grained materials, the π-method and the double exposure method were examined. In addition, it is clarified that the divergence of the X-ray beam causes the error of the diffraction angle.
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Report
(4 results)
Research Products
(18 results)
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[Presentation] 直接法によるX線応力測定2015
Author(s)
鈴木賢治
Organizer
第49回X線材料強度に関するシンポジウム
Place of Presentation
エル・おおさか(大阪市中央区北浜東 3-14)
Year and Date
2015-07-16
Related Report
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