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Investigation of formation mechanism of crystal defects induced by machining at the surface of single crystal SiC

Research Project

Project/Area Number 26420071
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Research Field Production engineering/Processing studies
Research InstitutionJapan Fine Ceramics Center

Principal Investigator

ISHIKAWA Yukari  一般財団法人ファインセラミックスセンター, その他部局等, 主席研究員 (60416196)

Co-Investigator(Kenkyū-buntansha) 菅原 義弘  一般財団法人ファインセラミックスセンター, その他部局等, 上級研究員 (70466291)
姚 永昭  一般財団法人ファインセラミックスセンター, その他部局等, 上級研究員 (80523935)
Project Period (FY) 2014-04-01 – 2017-03-31
Project Status Completed (Fiscal Year 2016)
Budget Amount *help
¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000)
Fiscal Year 2016: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2015: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2014: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
Keywords材料工学 / 単結晶 / 加工 / 潜傷 / 転位 / 積層欠陥 / SiC / 欠陥 / EBSD / SiC / ダイヤ
Outline of Final Research Achievements

We investigated the defect structures in 4H-SiC single crystal induced by the model machining under control of abrasive motion. Wiresawing with fixed abrasive i.e. machining with abrasive translation uniformly introduced defects: high density defective layer, dislocation half loops, and stacking faults. On the other hand, distributed defects: stacking fault and triangular defective area with dislocation half-loop bundle were formed after wiresawing with loose abrasive i.e. machining with abrasive translation and rotation.

Report

(4 results)
  • 2016 Annual Research Report   Final Research Report ( PDF )
  • 2015 Research-status Report
  • 2014 Research-status Report
  • Research Products

    (4 results)

All 2016 2015 2014

All Journal Article (2 results) (of which Peer Reviewed: 2 results,  Acknowledgement Compliant: 1 results) Presentation (2 results) (of which Int'l Joint Research: 1 results)

  • [Journal Article] Fast removal of surface damage layer from single crystal diamond by using chemical etching in molten KCl + KOH solution2016

    • Author(s)
      Y. Yao, Y. Ishikawa, Y. Sugawara, H. Yamada, A. Chayahara, Y.Mokuno
    • Journal Title

      Diamond & Related Materials

      Volume: 63 Pages: 86-90

    • DOI

      10.1016/j.diamond.2015.10.003

    • Related Report
      2015 Research-status Report
    • Peer Reviewed
  • [Journal Article] Comparison of slicing-induced damage in hexagonal SiC by wire sawing with loose abrasive,wire sawing with fixed abrasive, and electric discharge machining2014

    • Author(s)
      Yukari Ishikawa, Yong-Zhao Yao, Yoshihiro Sugawara, Koji Sato, Yoshihiro Okamoto,Noritaka Hayashi, Benjamin Dierre, Kentaro Watanabe, and Takashi Sekiguchi
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 53 Issue: 7 Pages: 1-11

    • DOI

      10.7567/jjap.53.071301

    • NAID

      210000144159

    • Related Report
      2014 Research-status Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Presentation] Fast removal of surface damage layer from single crystal diamond by using chemical etching in molten KCl + KOH solution2015

    • Author(s)
      Y. Yao, Y. Ishikawa, Y. Sugawara, H. Yamada, A. Chayahara, Y.Mokuno
    • Organizer
      The 9th International Conference on New Diamond and Nano Carbons
    • Place of Presentation
      静岡グランシップ
    • Year and Date
      2015-05-24
    • Related Report
      2015 Research-status Report
    • Int'l Joint Research
  • [Presentation] 遊離砥粒ワイヤーソーと放電加工で切断表面に導入された欠陥の比較2014

    • Author(s)
      石川由加里,姚 永昭,佐藤功二,菅原義弘,岡本好弘,林 紀孝
    • Organizer
      先進パワー半導体分科会 第1回講演会
    • Place of Presentation
      ウインクあいち
    • Year and Date
      2014-11-19 – 2014-11-20
    • Related Report
      2014 Research-status Report

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Published: 2014-04-04   Modified: 2018-03-22  

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