| Project/Area Number |
26600009
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Nanostructural physics
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| Research Institution | Chiba University |
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Principal Investigator |
Aoki Nobuyuki 千葉大学, 融合科学研究科(研究院), 准教授 (60312930)
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| Co-Investigator(Kenkyū-buntansha) |
OCHIAI Yuichi 千葉大学, 大学院融合科学研究科, 名誉教授 (60111366)
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| Project Period (FY) |
2014-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2015: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2014: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
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| Keywords | 走査ゲート顕微法（SGM） / 磁気力顕微法（MFM） / 走査電気磁気効果複合顕微法（SEMEM） / 局在スピン / 走査ゲートスペクトロスコピー（SGS） / 走査磁気電気複合顕微法 / 走査ゲート顕微法 / 磁気力顕微法 / 静電気力顕微法 / チューニングフォーク / 走査電気磁気複合顕微鏡 |
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| Outline of Final Research Achievements |
A new scanning probe technique, Scanning Electronic-Magnetic Effect Microscopy (SEMEM), has been studied by combining both scanning probe techniques such as Scanning Gate Microscopy (SGM) and Magnetic Force Microscopy (MFM) in order to detect a localized spin induced by electric field. By sweeping the probe voltage or the source-drain voltage with fixing the tip position on the sample surface, a new probing technique namely a Scanning Gate Spectroscopy (SGS) has been realized in this study. In addition, using a ferromagnetic tip, the technique can be expected to detect a localized spin moment.
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