Development of Scanning Electronic-Magnetic Effect Microscopy (SEMEM) for electric-field-induced localized spin detection
Project/Area Number |
26600009
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Research Category |
Grant-in-Aid for Challenging Exploratory Research
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Allocation Type | Multi-year Fund |
Research Field |
Nanostructural physics
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Research Institution | Chiba University |
Principal Investigator |
Aoki Nobuyuki 千葉大学, 融合科学研究科(研究院), 准教授 (60312930)
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Co-Investigator(Kenkyū-buntansha) |
OCHIAI Yuichi 千葉大学, 大学院融合科学研究科, 名誉教授 (60111366)
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Project Period (FY) |
2014-04-01 – 2016-03-31
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Project Status |
Completed (Fiscal Year 2015)
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Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2015: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2014: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
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Keywords | 走査ゲート顕微法(SGM) / 磁気力顕微法(MFM) / 走査電気磁気効果複合顕微法(SEMEM) / 局在スピン / 走査ゲートスペクトロスコピー(SGS) / 走査磁気電気複合顕微法 / 走査ゲート顕微法 / 磁気力顕微法 / 静電気力顕微法 / チューニングフォーク / 走査電気磁気複合顕微鏡 |
Outline of Final Research Achievements |
A new scanning probe technique, Scanning Electronic-Magnetic Effect Microscopy (SEMEM), has been studied by combining both scanning probe techniques such as Scanning Gate Microscopy (SGM) and Magnetic Force Microscopy (MFM) in order to detect a localized spin induced by electric field. By sweeping the probe voltage or the source-drain voltage with fixing the tip position on the sample surface, a new probing technique namely a Scanning Gate Spectroscopy (SGS) has been realized in this study. In addition, using a ferromagnetic tip, the technique can be expected to detect a localized spin moment.
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Report
(3 results)
Research Products
(30 results)
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[Presentation] 走査ゲートによるMoS2トランジスタの視覚化2016
Author(s)
樋口 絢香, 松永 正広, He Guanchen, Bird Jonathan, 落合 勇一, 青木 伸之
Organizer
第50回フラーレン・ナノチューブ・グラフェン総合シンポジウム
Place of Presentation
東京大学
Year and Date
2016-02-19
Related Report
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[Presentation] Scanning gate imaging of MoS2 transistors2015
Author(s)
Masahiro Matsunaga, Ayaka Higuchi, Guanchen He, Yuichi Ochiai, Jonathan Bird and Nobuyuki Aoki
Organizer
International Symposium on Advanced Nanodevices and Nanotechnology 2015 (ISANN2015)
Place of Presentation
Hawaii, U.S.A.
Year and Date
2015-11-30
Related Report
Int'l Joint Research
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