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Measurement conditions of atomic-resolution optical imaging in near-field scanning optical microscopy using the force detection

Research Project

Project/Area Number 26600013
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeMulti-year Fund
Research Field Nanostructural physics
Research InstitutionOsaka University

Principal Investigator

SUGAWARA YASUHIRO  大阪大学, 工学(系)研究科(研究院), 教授 (40206404)

Project Period (FY) 2014-04-01 – 2016-03-31
Project Status Completed (Fiscal Year 2015)
Budget Amount *help
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2015: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2014: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
Keywordsナノプローブ / 走査プローブ顕微鏡
Outline of Final Research Achievements

Atomic-resolution optical imaging that overcomes the diffraction limit of light is a challenging task. However, atomic-resolution imaging of the optical field has not yet been achieved. Recently, we investigate the high-resolution imaging of the optical near-field on a surface using the force detection.In this method, the surface photovoltage of the silicon tip apex induced by the optical near-field on the surface is measured by the force between the tip and the surface. Here, we clarified the measurement conditions for the atomic-resolution optical imaging.

Report

(3 results)
  • 2015 Annual Research Report   Final Research Report ( PDF )
  • 2014 Research-status Report
  • Research Products

    (15 results)

All 2016 2015 2014 Other

All Int'l Joint Research (1 results) Journal Article (5 results) (of which Peer Reviewed: 5 results,  Open Access: 5 results,  Acknowledgement Compliant: 5 results) Presentation (7 results) (of which Int'l Joint Research: 3 results,  Invited: 7 results) Remarks (2 results)

  • [Int'l Joint Research] Slovak Academy of Science(Slovakia)

    • Related Report
      2015 Annual Research Report
  • [Journal Article] Distance dependence of atomic-resolution near-field imaging on α-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip2016

    • Author(s)
      Junsuke Yamanishi, Takashi Tokuyama, Yoshitaka Naitoh, Yan Jun Li, and Yasuhiro Sugawara
    • Journal Title

      Nano Research

      Volume: 9 Issue: 2 Pages: 530-536

    • DOI

      10.1007/s12274-015-0934-4

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Atomic-Resolution Imaging of the Optical Near Field Based on the Surface Photovoltage of a Silicon Probe Tip2015

    • Author(s)
      Yasuhiro Sugawara, Junsuke Yamanishi, Takashi Tokuyama, Yoshitaka Naitoh, and Yan Jun Li
    • Journal Title

      PHYSICAL REVIEW APPLIED

      Volume: 3 Issue: 4

    • DOI

      10.1103/physrevapplied.3.044020

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance2015

    • Author(s)
      Eiji Arima, Yoshitaka Naitoh, Yan Jun Li, Satoru Yoshimura, Hitoshi Saito, Hikaru Nomura, Ryoichi Nakatani and Yasuhiro Sugawara
    • Journal Title

      Nanotechnology

      Volume: 26 Issue: 12 Pages: 125701-6

    • DOI

      10.1088/0957-4484/26/12/125701

    • Related Report
      2014 Research-status Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Image Formation and Contrast Inversion in NC-AFM Imaging of the Oxidized Cu(110) Surfaces2014

    • Author(s)
      J. Bamidele, Y. Kinoshita, R. Turansky, S. H. Lee, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Stich, L. Kantorovich
    • Journal Title

      Phys. Rev. B

      Volume: 90 Issue: 3 Pages: 035410-035417

    • DOI

      10.1103/physrevb.90.035410

    • Related Report
      2014 Research-status Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism2014

    • Author(s)
      J. Bamidele, S. H. Lee, Y. Kinoshita, R. Turansky, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Stich, and L. Kantorovich
    • Journal Title

      Nature Commun.

      Volume: 5 Issue: 1 Pages: 1-7

    • DOI

      10.1038/ncomms5476

    • Related Report
      2014 Research-status Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Presentation] Atomic Resolution Imaging of Photon-induced Force on the Sapphire α-Al2O3(0001) Surface2015

    • Author(s)
      Y. Sugawara, J. Yamanishi, Y. Naitoh and Y. J. Li
    • Organizer
      The international symposium on Recent Trends in Analysis Techniques for Functional Materials and Devices
    • Place of Presentation
      Osaka University, Japan
    • Year and Date
      2015-11-03
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Atomic Resolution Imaging of topography and optical near-field on insulating Surface2015

    • Author(s)
      J. Yamanishi, Y. Naitoh, Y. J. Li, Y. Sugawara
    • Organizer
      The Third China-Japan symposium on Nanomedicine
    • Place of Presentation
      Beijing, China
    • Year and Date
      2015-06-19
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Atomic Resolution Imaging of topography and optical near-field on the sapphire α-Al2O3 (0001) Surface2015

    • Author(s)
      Y. Sugawara, J. Yamanishi, Y. Naitoh, Y. J. Li
    • Organizer
      Collaborative Conference on 3D and Materials Research (CC3DMR)
    • Place of Presentation
      Busan, South Krorea
    • Year and Date
      2015-06-15
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] SPMによる原子レベル表面磁性計測の最先端2014

    • Author(s)
      菅原康弘
    • Organizer
      日本顕微鏡学会シンポジウム
    • Place of Presentation
      九州大学百年講堂(福岡県福岡市)
    • Year and Date
      2014-11-17
    • Related Report
      2014 Research-status Report
    • Invited
  • [Presentation] Surface Potential Measurement of TiO2(110) by Using Atomic Force microscopy (AFM)/Kelvin Probe Force Microscopy (KPFM)2014

    • Author(s)
      Y. Sugawara, L. Kou, R. Kanbarashi, H. F. Wen and Y. J. Li
    • Organizer
      Collaborative Conference on 3D & Materials Research
    • Place of Presentation
      Incheon, Korea
    • Year and Date
      2014-06-24
    • Related Report
      2014 Research-status Report
    • Invited
  • [Presentation] 走査型プローブ顕微鏡(SPM)2014

    • Author(s)
      菅原康弘
    • Organizer
      第57回表面科学基礎講座
    • Place of Presentation
      大阪大学コンベンションセンター(大阪府吹田市)
    • Year and Date
      2014-06-04 – 2014-06-05
    • Related Report
      2014 Research-status Report
    • Invited
  • [Presentation] Atomic resolution Imaging of Optical Near-field2014

    • Author(s)
      Y. Sugawara, S. Yamada, M. Furukawa, T. Tokuyama,
    • Organizer
      The second Japan-China Symposium on Nanomedicine
    • Place of Presentation
      Hiroshima University(広島県広島市)
    • Year and Date
      2014-05-16 – 2014-05-17
    • Related Report
      2014 Research-status Report
    • Invited
  • [Remarks] 大阪大学大学院工学研究科精密科学・応用物理学専攻ナノ物性工学領域

    • URL

      http://nanophysics.ap.eng.osaka-u.ac.jp/

    • Related Report
      2015 Annual Research Report
  • [Remarks] 大阪大学大学院工学研究科 応用物理学コース ナノ物性工学領域

    • URL

      http://nanophysics.ap.eng.osaka-u.ac.jp/

    • Related Report
      2014 Research-status Report

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Published: 2014-04-04   Modified: 2017-05-10  

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