Measurement conditions of atomic-resolution optical imaging in near-field scanning optical microscopy using the force detection
Project/Area Number |
26600013
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Research Category |
Grant-in-Aid for Challenging Exploratory Research
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Allocation Type | Multi-year Fund |
Research Field |
Nanostructural physics
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Research Institution | Osaka University |
Principal Investigator |
SUGAWARA YASUHIRO 大阪大学, 工学(系)研究科(研究院), 教授 (40206404)
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Project Period (FY) |
2014-04-01 – 2016-03-31
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Project Status |
Completed (Fiscal Year 2015)
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Budget Amount *help |
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2015: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2014: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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Keywords | ナノプローブ / 走査プローブ顕微鏡 |
Outline of Final Research Achievements |
Atomic-resolution optical imaging that overcomes the diffraction limit of light is a challenging task. However, atomic-resolution imaging of the optical field has not yet been achieved. Recently, we investigate the high-resolution imaging of the optical near-field on a surface using the force detection.In this method, the surface photovoltage of the silicon tip apex induced by the optical near-field on the surface is measured by the force between the tip and the surface. Here, we clarified the measurement conditions for the atomic-resolution optical imaging.
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Report
(3 results)
Research Products
(15 results)
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[Presentation] 走査型プローブ顕微鏡(SPM)2014
Author(s)
菅原康弘
Organizer
第57回表面科学基礎講座
Place of Presentation
大阪大学コンベンションセンター(大阪府吹田市)
Year and Date
2014-06-04 – 2014-06-05
Related Report
Invited
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