Development of an apparatus for near-field Raman spectroscopy under transmission electron microscopy toward the degradation analyses of lithium ion battery

• Project/Area Number: 26600038
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Nanomaterials engineering
• Research Institution: Tohoku University
• Principal Investigator: OHNO YUTAKA 東北大学, 金属材料研究所, 准教授 (80243129)
• Project Period (FY): 2014-04-01 – 2016-03-31
• Project Status: Completed (Fiscal Year 2015)
• Budget Amount: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000); Fiscal Year 2015: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000); Fiscal Year 2014: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
• Keywords: 透過電子顕微鏡内その場分光 / ラマン分光 / 散乱型近接場光 / リチウムイオン電池 / 近接場分光 / 透過電子顕微鏡 / 近接場ラマン分光

Outline of Final Research Achievements

An intense laser probe about 10 micrometer in diameter was formed on a specimen under transmission electron microscopy (TEM). With the light probe, micro-Raman spectroscopy under TEM, with a spatial resolution of the order of 10 micrometer simultaneously with an energy resolution of 6 meV, was demonstrated.
A metal tip covered with silver nanoparticles (60 nanometer in diameter) was placed on an arbitrary position in the above-mentioned laser probe, and a near-field light was induced at the apex by a tip-enhanced effect. However, the intensity of the near-field light was too low to demonstrate near-field Raman spectroscopy under TEM with a spatial resolution of 60 nanometer.

Research Products

• [Journal Article] Nanoscopic mechanism of Cu precipitation at small-angle tilt boundaries in Si (2015)
  • Author(s): Y. Ohno, K. Inoue, K. Kutsukake, M. Deura, T. Ohsawa, I. Yonenaga, H. Yoshida, S. Takeda, R. Taniguchi, H. Otsubo, S. R. Nishitani, N. Ebisawa, Y. Shimizu, H. Takamizawa, K. Inoue, Y. Nagai
  • Journal Title: Physical Reviwe B Volume: 91 Issue: 23
  • DOI: 10.1103/physrevb.91.235315
  • Peer Reviewed / Acknowledgement Compliant
• [Presentation] Three-dimensional evaluation of segregation ability at grain boundaries in Si by atom probe tomography combined with transmission electron microscopy (2016)
  • Author(s): Y. Ohno
  • Organizer: European Materials Research Society 2016 Spring Meeting
  • Place of Presentation: Lille, France
  • Year and Date: 2016-05-02
  • Int'l Joint Research / Invited
• [Presentation] Impurity segregation at small angle tilt boundaries in silicon: nanoscopic mechanisms and applications (2016)
  • Author(s): Y. Ohno
  • Organizer: Energy, Materials, and Nanotechnology (EMN) Photovoltaics Meeting 2016
  • Place of Presentation: Hong Kong, China
  • Year and Date: 2016-01-18
  • Int'l Joint Research / Invited
• [Presentation] シリコン中の小傾角粒界における酸素の偏析機構 (2015)
  • Author(s): 大野裕, 井上海平, 藤原航三, 出浦桃子, 沓掛健太朗, 米永一郎, 清水康雄, 井上耕治, 海老澤直樹, 永井康介
  • Organizer: 日本物理学会2015年秋季大会
  • Place of Presentation: 関西大学, 大阪
  • Year and Date: 2015-09-16
• [Presentation] Near-field light probe towards in-situ Raman spectroscopy under transmission electron microscopy (2015)
  • Author(s): Y. Ohno, I. Yonenaga
  • Organizer: 28th International Conference on Defects in Semiconductors
  • Place of Presentation: Espoo, Finland
  • Year and Date: 2015-07-27 – 2015-07-31
• [Presentation] Near-field light probe towards in-situ Raman spectroscopy under transmission electron microscopy (2015)
  • Author(s): Y. Ohno, I. Yonenaga
  • Organizer: 28th International Conference on Defects in Semiconductors (ICDS2015)
  • Place of Presentation: Espoo, Finland
  • Year and Date: 2015-07-27
  • Int'l Joint Research
• [Presentation] Accumulation of oxygen atoms at small-angle tilt boundaries in silicon (2015)
  • Author(s): Y. Ohno, K. Inoue, K. Fujiwara, M. Deura, K. Kutsukake, I. Yonenaga, Y. Shimizu, K. Inoue, N. Ebisawa, Y. Nagai
  • Organizer: 8th International Workshop on Crystalline Silicon Solar Cells (CSSC8)
  • Place of Presentation: Bamberg, Bavaria, Germany
  • Year and Date: 2015-05-05
  • Int'l Joint Research
• [Presentation] Effects of bond distortions on impurity segregation in high-angle grain boundaries in silicon (2015)
  • Author(s): Y. Ohno, K. Inoue, M. Deura, K. Kutsukake, I. Yonenaga, N. Ebisawa, Y. Shimizu, K. Inoue, Y. Nagai, H. Yoshida, S. Takeda, S. Tanaka, M. Kohyama
  • Organizer: Materials Research Society 2015 Spring Meeting
  • Place of Presentation: San Francisco, USA
  • Year and Date: 2015-04-06
  • Int'l Joint Research
• [Presentation] 透過電子顕微鏡による半導体欠陥の電子的・動的特性のナノスケール直視評価 (2015)
  • Author(s): 大野裕
  • Organizer: 独立行政法人日本学術振興会結晶成長の科学と技術第161委員会 第89回研究会「結晶加工と評価」
  • Place of Presentation: 橿原ロイヤルホテル, 奈良
  • Year and Date: 2015-01-08 – 2015-01-09
  • Invited
• [Presentation] 電池材料の局所境界構造と機能 (2014)
  • Author(s): 大野裕
  • Organizer: 日本物理学会2014年秋季大会
  • Place of Presentation: 中部大学, 愛知
  • Year and Date: 2014-09-07 – 2014-09-10