Investigation of Hydrogen Bond by Bias Noncontact Atomic Force Microscopy/Spectroscopy

• Project/Area Number: 26600098
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Kanazawa University
• Principal Investigator: ARAI Toyoko 金沢大学, 数物科学系, 教授 (20250235)
• Project Period (FY): 2014-04-01 – 2016-03-31
• Project Status: Completed (Fiscal Year 2015)
• Budget Amount: ¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000); Fiscal Year 2015: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000); Fiscal Year 2014: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
• Keywords: 走査型プローブ顕微鏡 / 水素結合

Outline of Final Research Achievements

The hydrogen bond was investigated with atomic resolution by a homebuilt non-contact atomic force microscope (nc-AFM) in ultrahigh vacuum. The hydrogen bond [X-H…A] was made with an apex atom of a clean Si tip as a proton acceptor (A) and a proton donor (X-H) adsorbed on a sample substrate. The samples were Si(111)7x7 surfaces adsorbed NH2 group and H group. I identified those adsorption sites from Nc-AFM images, tunneling current images and Δf- distance curves. The maximum covalent bonding force of Si-Si was approximately 1.0 (nN). I estimated that the hydrogen bonding force between the NH2 group and the Si tip [Si-N-H…Si] was approximately 0.05 (nN) and between the H group and the Si tip [Si-H…Si] was approximately 0.1 (nN).

Research Products

• [Journal Article] Evaluation and optimization of quartz resonant-frequency retuned fork force sensors with high Q factors, and the associated electric circuits, for non-contact atomic force microscopy (2016)
  • Author(s): Hiroaki Ooe, Mikihiro Fujii, Masahiko Tomitori, Toyoko Arai
  • Journal Title: Review of Scientific Instruments Volume: 87 Issue: 2
  • DOI: 10.1063/1.4941065
  • Peer Reviewed / Open Access / Acknowledgement Compliant
• [Journal Article] Atomic-scale electric capacitive change detected with a charge amplifier installed in a non-contact atomic force microscope (2016)
  • Author(s): Makoto Nogami, Akira Sasahara, Toyoko Arai, Masahiko Tomitori
  • Journal Title: Applied Physics Express Volume: 9 Issue: 4 Pages: 046601-046601
  • DOI: 10.7567/apex.9.046601
  • NAID: 210000137866
  • Peer Reviewed / Open Access / Acknowledgement Compliant
• [Journal Article] Combined scanning tunneling microscopy, spectroscopy, and atomic force microscopy reveal that single atom tips maximize the intensity of inelastic tunneling spectroscopy data (2016)
  • Author(s): 1.Norio Okabayashi, Alexander Gustafsson, Angelo Peronio, Magnus Paulsson, Toyoko Arai, and Franz J. Giessibl
  • Journal Title: Phys. Rev. B Volume: 93 Issue: 16
  • DOI: 10.1103/physrevb.93.165415
  • Peer Reviewed / Int'l Joint Research
• [Journal Article] Atom-Resolved Analysis of an Ionic KBr(001) Crystal Surface Covered with a Thin Water Layer by Frequency Modulation Atomic Force Microscopy (2015)
  • Author(s): T. Arai, M.i Koshioka, K. Abe, M. Tomitori , R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi, and N. Oyabu
  • Journal Title: Langmuir Volume: 31 Issue: 13 Pages: 3876-3883
  • DOI: 10.1021/acs.langmuir.5b00087
  • Peer Reviewed
• [Journal Article] Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy (2014)
  • Author(s): H. Ooe, T. Sakuishi, M. Nogami, M. Tomitori and T. Arai
  • Journal Title: Appl. Phys. Lett. Volume: 105 Issue: 4
  • DOI: 10.1063/1.4891882
  • NAID: 120005650332
  • Peer Reviewed / Open Access / Acknowledgement Compliant
• [Journal Article] Thermal transformation of 4,4”-diamino-p-terphenyl on a Si(111)-7×7 surface analyzed by X-ray photoemission spectroscopy and scanning tunneling microscopy (2014)
  • Author(s): T. Nishimura, A. Sasahara, H. Murata, T. Arai and M. Tomitori
  • Journal Title: J. Phys. Chem. C Volume: 118 Issue: 43 Pages: 25104-25109
  • DOI: 10.1021/jp508680a
  • Peer Reviewed / Open Access / Acknowledgement Compliant
• [Presentation] 非接触原子間力顕微鏡におけるジュール発熱によるエネルギー散逸の研究 (2016)
  • Author(s): 稲村 竜、富取 正彦、新井 豊子
  • Organizer: 第63回応用物理学会春季学術講演会
  • Place of Presentation: 東京工業大学（東京都）
  • Year and Date: 2016-03-19
• [Presentation] 電気伝導と力学特性の同時測定による金ナノ接点の原子配列の考察 (2016)
  • Author(s): 橋本 遼太、新井 豊子、村上 拓 、石塚 彗介、大島 義文、富取 正彦
  • Organizer: 第63回応用物理学会春季学術講演会
  • Place of Presentation: 東京工業大学（東京都）
  • Year and Date: 2016-03-19
• [Presentation] Bimodal FM-AFMを用いたKBr(100)表面の大気中原子分解能観察 Atomic resolution observation on KBr(100) surface with bimodal FM-AFM in ambient (2016)
  • Author(s): 大江 弘晃、Diminik Kirpal、Daniel S. Wastl、Alfred J. Weymouth、Franz J. Giessibl、新井 豊子
  • Organizer: 第63回応用物理学会春季学術講演会
  • Place of Presentation: 東京工業大学（東京都）
  • Year and Date: 2016-03-19
• [Presentation] チャージアンプを備えたnc-AFMによる表面電子状態解析 (2016)
  • Author(s): 野上 真、新井 豊子、笹原 亮、富取 正彦
  • Organizer: 第63回応用物理学会春季学術講演会
  • Place of Presentation: 東京工業大学（東京都）
  • Year and Date: 2016-03-19
• [Presentation] 探針先端の規定された非弾性電子トンネル分光における実験と理論の比較 (2016)
  • Author(s): 岡林則夫, Alexander Gustafsson, Angelo Peronio, Magnus Paulsson, 新井豊子, Franz J. Giessibl
  • Organizer: 日本物理学会第71回年次大会
  • Place of Presentation: 東北学院大学（宮城県）
  • Year and Date: 2016-03-19
• [Presentation] Atom-resolved analysis of solid surfaces covered with thin water layers in air by frequency modulation atomic force microscopy (2015)
  • Author(s): Toyoko Arai, Kohei Sato, Masashi Koshioka, Asuka Iida
  • Organizer: 23rd International Colloquium on Scanning Probe Microscopy (ICSPM23)
  • Place of Presentation: ヒルトンニセコビレッジホテル（北海道）
  • Year and Date: 2015-12-10
  • Int'l Joint Research
• [Presentation] 金ナノ接点の電気伝導と力学特性の同時測定 (2015)
  • Author(s): 橋本遼太，新井豊子，大島義文，富取正彦
  • Organizer: 第35回表面科学学術講演会、第56回真空に関する連合講演会（2015年真空・表面科学合同講演会）
  • Place of Presentation: つくば国際会議場（茨城県）
  • Year and Date: 2015-12-01
• [Presentation] 金ナノ接点の力学的・電気的特性の同時測定法の検討 (2015)
  • Author(s): 村上 拓、橋本 遼太、石塚 慧介、大島 義文、富取 正彦、新井豊子
  • Organizer: 2015年度日本物理学会北陸支部定例学術講演会
  • Place of Presentation: 金沢大学（石川県）
  • Year and Date: 2015-11-28
• [Presentation] 周波数変調原子間力顕微鏡による水膜中固体表面の原子分解観察 (2015)
  • Author(s): 佐藤 昂平，飯田 明日香，新井 豊子
  • Organizer: 2015年度日本物理学会北陸支部定例学術講演会
  • Place of Presentation: 金沢大学（石川県）
  • Year and Date: 2015-11-28
• [Presentation] Frequency modulation-atomic force microscopy imaging of solid surfaces covered with thin water layers in air (2015)
  • Author(s): Toyoko Arai, Masashi Koshioka, Kohei Sato
  • Organizer: 表面界面スペクトロスコピー2015
  • Place of Presentation: 国立女性教育会館（埼玉県）
  • Year and Date: 2015-11-27
• [Presentation] CO分子に対するSTM/AFMを用いた非弾性電子トンネル分光における探針先端の役割 (2015)
  • Author(s): 岡林則夫, Alexander Gustafsson, Angelo Peronio, Magnus Paulsson, 新井豊子, Franz J. Giessibl
  • Organizer: 日本物理学会2015年秋季大会
  • Place of Presentation: 関西大学千里山キャンパス（大阪府）
  • Year and Date: 2015-09-16
• [Presentation] 長辺振動水晶振動子を力学センサーに応用した金ナノ接点の力学・電気伝導特性の同時計測 (2015)
  • Author(s): 橋本 遼太、新井 豊子 、大島 義文 、富取 正彦
  • Organizer: 第76回応用物理学会秋季学術講演会
  • Place of Presentation: 名古屋国際会議場（愛知県）
  • Year and Date: 2015-09-13
• [Presentation] Dissipation decrease in a proximity region enhanced with a hydrogen-terminated Si tip in non-contact atomic force microscopy (2015)
  • Author(s): R. Inamura, M. Tomitori, T. Arai
  • Organizer: 18th International Conference on non contact Atomic Force Microscopy (ncAFM2015)
  • Place of Presentation: Cassis, France
  • Year and Date: 2015-09-07
  • Int'l Joint Research
• [Presentation] Simultaneous NC-AFM imaging with current and damping energy using a retuned fork sensor with a high Q-value (2015)
  • Author(s): H. Ooe, M. Fujii, M. Tomitori, T. Arai
  • Organizer: 18th International Conference on non contact Atomic Force Microscopy (ncAFM2015)
  • Place of Presentation: Cassis, France
  • Year and Date: 2015-09-07
  • Int'l Joint Research
• [Presentation] Tip-sample distance dependence of the output of a charge amplifier in NC-AFM (2015)
  • Author(s): M. Nogami, T. Arai, A. Sasahara, M. Tomitori
  • Organizer: 18th International Conference on non contact Atomic Force Microscopy (ncAFM2015)
  • Place of Presentation: Cassis, France
  • Year and Date: 2015-09-07
  • Int'l Joint Research
• [Presentation] 非接触原子間力顕微鏡/力分光法によるNH3反応Si(111)-(7x7)表面上のNH2とH吸着基の判別 (2015)
  • Author(s): 坂野 友樹, 富取 正彦, 新井 豊子
  • Organizer: 第62回応用物理学会春期学術講演会
  • Place of Presentation: 東海大学湘南キャンパス（神奈川県平塚市）
  • Year and Date: 2015-03-11 – 2015-03-14
• [Presentation] 非接触原子間力顕微鏡におけるSi探針上の水素終端膜によるエネルギー散逸量への影響 (2015)
  • Author(s): 稲村 竜、坂野 友樹, 富取 正彦, 新井 豊子
  • Organizer: 第62回応用物理学会春期学術講演会
  • Place of Presentation: 東海大学湘南キャンパス（神奈川県平塚市）
  • Year and Date: 2015-03-11 – 2015-03-14
• [Presentation] 容量補償回路を用いたNC-AFM用検出回路の低雑音化 (2015)
  • Author(s): 大江 弘晃, 藤居 幹大, 新井 豊子
  • Organizer: 第62回応用物理学会春期学術講演会
  • Place of Presentation: 東海大学湘南キャンパス（神奈川県平塚市）
  • Year and Date: 2015-03-11 – 2015-03-14
• [Presentation] 周波数変調原子間力顕微鏡によるNaCl(001)表面の大気中原子分解能観察 (2015)
  • Author(s): 阿部晃平, 新井 豊子
  • Organizer: 第62回応用物理学会春期学術講演会
  • Place of Presentation: 東海大学湘南キャンパス（神奈川県平塚市）
  • Year and Date: 2015-03-11 – 2015-03-14
• [Presentation] NC-AFMに組み込んだチャージアンプと電流アンプ出力の同時計測 (2015)
  • Author(s): 野上真、新井豊子、笹原亮、富取正彦
  • Organizer: 第62回応用物理学会春期学術講演会
  • Place of Presentation: 東海大学湘南キャンパス（神奈川県平塚市）
  • Year and Date: 2015-03-11 – 2015-03-14
• [Presentation] Force sensor of a resonance frequency-retuned quartz tuning fork with a high Q-value for non-contact atomic force microscopy (2014)
  • Author(s): Hiroaki Ooe, Toyoko Arai
  • Organizer: 22nd International Colloquium on Scanning Probe Microscopy (ICSPM22)
  • Place of Presentation: 熱川ハイツ（静岡県東伊豆町）
  • Year and Date: 2014-12-11 – 2014-12-13
• [Presentation] Force spectroscopy of an NH3-reacted Si(111)-(7×7) surface by non-contact AFM with different tip states (2014)
  • Author(s): T. Arai, Y. Sakano, R. Inamura, M. Tomitori
  • Organizer: 22nd International Colloquium on Scanning Probe Microscopy (ICSPM22)
  • Place of Presentation: 熱川ハイツ（静岡県東伊豆町）
  • Year and Date: 2014-12-11 – 2014-12-13
• [Presentation] 非接触原子間力顕微鏡/力分光による微量NH3を反応させたSi(111)-7x7 表面の電子状態解析 (2014)
  • Author(s): 坂野 友樹, 富取 正彦, 新井 豊子
  • Organizer: 第75回応用物理学会秋期学術講演会
  • Place of Presentation: 北海道大学札幌キャンパス（北海道札幌市）
  • Year and Date: 2014-09-17 – 2014-09-20
• [Presentation] SPM探針への応用に向けたタングステン酸化物の針状結晶成長法 (2014)
  • Author(s): 永島一樹, 富取 正彦, 新井 豊子
  • Organizer: 第75回応用物理学会秋期学術講演会
  • Place of Presentation: 北海道大学札幌キャンパス（北海道札幌市）
  • Year and Date: 2014-09-17 – 2014-09-20
• [Presentation] NC-AFMに組込んだチャージアンプの出力解析 (2014)
  • Author(s): 野上 真，新井 豊子，笹原 亮，富取 正彦
  • Organizer: 第75回応用物理学会秋期学術講演会
  • Place of Presentation: 北海道大学札幌キャンパス（北海道札幌市）
  • Year and Date: 2014-09-17 – 2014-09-20
• [Presentation] Atomic contrast change of NH3–reacted Si(111)-7x7 surfaces observed by non-contact atomic force microscopy (2014)
  • Author(s): Toyoko Arai, Yuki Sakano, Masahiko Tomitori
  • Organizer: the 17th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: つくば国際会議場（茨城県つくば市）
  • Year and Date: 2014-08-04 – 2014-08-08
• [Presentation] High Q-value and noise reduction for a retuning quartz force sensor (2014)
  • Author(s): Hiroaki Ooe, Masahiko Tomitori, Toyoko Arai
  • Organizer: the 17th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: つくば国際会議場（茨城県つくば市）
  • Year and Date: 2014-08-04 – 2014-08-08
• [Presentation] Atom-resolved FM-AFM imaging of a KBr(001) surface covered with water layers in air with high humidity (2014)
  • Author(s): T. Arai, M. Koshioka, K. Abe, M. Tomitori, R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi, N. Oyabu
  • Organizer: the 17th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: つくば国際会議場（茨城県つくば市）
  • Year and Date: 2014-08-04 – 2014-08-08
• [Presentation] Nanoscale capacitive analysis of surface states using a charge amplifier based on non-contact atomic force microscopy (2014)
  • Author(s): Makoto Nogami, Toyoko Arai, Akira Sasahara, Masahiko Tomitori
  • Organizer: the 17th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: つくば国際会議場（茨城県つくば市）
  • Year and Date: 2014-08-04 – 2014-08-08