Creation of semiconductor surface for the next generation by catalytic tool free from metallic element
Project/Area Number |
26630026
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Research Category |
Grant-in-Aid for Challenging Exploratory Research
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Allocation Type | Multi-year Fund |
Research Field |
Production engineering/Processing studies
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Research Institution | Osaka University |
Principal Investigator |
ARIMA KENTA 大阪大学, 工学(系)研究科(研究院), 准教授 (10324807)
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Project Period (FY) |
2014-04-01 – 2016-03-31
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Project Status |
Completed (Fiscal Year 2015)
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Budget Amount *help |
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2015: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2014: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
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Keywords | 表面工学 / 超精密加工 / 電気化学 / 加工学 / グラフェン / 触媒 / 半導体表面 / 超純水 |
Outline of Final Research Achievements |
The purpose of this study is to develop a non-metallic catalytic tool to remove protrusions selectively on a semiconductor surface by chemical interactions. We first need to find a catalyst that can etch a semiconductor surface effectively. In this research period, I obtained the results shown below. (1) I performed electrochemical measurements based on cyclic voltammetry to evaluate catalytic activities of materials. And I confirmed that graphene-based catalysts are promising for our project. (2) I have developed a method to deposit a graphene flake on a semiconductor surface. And I performed atomic force microscopy observations in water and found that a semiconductor surface around the deposited flakes is selectively etched. These results will help me to develop a non-metallic catalytic tool with high performances.
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Report
(3 results)
Research Products
(29 results)
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[Journal Article] Ambient-Pressure XPS Study of GeO2/Ge(100) and SiO2/Si(100) at Controlled Relative Humidity2014
Author(s)
Kenta Arima, Yoshie Kawai, Yuya Minoura, Yusuke Saito, Daichi Mori, Hiroshi Oka, Kentaro Kawai, Takuji Hosoi, Zhi Liu, Heiji Watanabe, and Mizuho Morita
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Journal Title
ECS Transactions
Volume: 64
Issue: 8
Pages: 77-82
DOI
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[Presentation] Ambient-Pressure XPS Study of GeO2/Ge(100) and SiO2/Si(100) at Controlled Relative Humidity2014
Author(s)
Kenta Arima, Yoshie Kawai, Yuya Minoura, Yusuke Saito, Daichi Mori, Hiroshi Oka, Kentaro Kawai, Takuji Hosoi, Zhi Liu, Heiji Watanabe, and Mizuho Morita
Organizer
226th Meeting of The Electrochemical Society
Place of Presentation
Cancun, Mexico
Year and Date
2014-10-06
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