| Project/Area Number |
26630119
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Electronic materials/Electric materials
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| Research Institution | Tohoku University |
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Principal Investigator |
ENDO YASUSHI 東北大学, 工学(系)研究科(研究院), 准教授 (50335379)
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| Project Period (FY) |
2014-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2015: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2014: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
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| Keywords | 高周波計測 / 高周波近傍電界 / Si探針 / 振幅変調方式 / 電界のうなり方式 / 作成・評価技術 / 高周波電界計測 / 計測工学 / 電子・電気材料 / 高周波電磁界計測 |
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| Outline of Final Research Achievements |
This study reports the development of our proposed high-frequency electric field imaging measurement technique for evaluating the electric field effect of spin at the local area of a nano-magnet. Both an amplitude modulation (AM) method and a beating electric field method were suggested as a detection method of this measurement technique. For each detection method, when a Si tip approached the CPW surface, the tip oscillated with the maximum amplitude at the cantilever resonance frequency. This results means that a Si tip can detect the HF electric near-field from a CPW using each detection method. Additionally, from the HF eletric near-field distribution of the CPW, it was pointed out that the dielectric materials composing of a cantilever with the tip are improved in order to detect the HF electric field of a nano-magnet on a trasmission line in detail. Therefore, these results reveal that the high-frequency electric field imaging measurement technique can be developed newly.
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