Research Project
Grant-in-Aid for Challenging Exploratory Research
A novel sensing technique for the instrumented indentation microscope is proposed for characterizing the mechanical properties of materials in nano/micro regimes by the use of scanning probe microscope. The key issue of this technique is determining the back-face displacement profile (BDP) of the novel multifunctional haptic indenter during indentation contact in situ. The finite element analysis (FEA) is utilized for that scanning probe microscope is capable of determining in a quantitative manner the back-face displacement profile of the haptic indenter.
All 2019 2018 2017 2016
All Journal Article (1 results) Presentation (3 results) Book (1 results) Patent(Industrial Property Rights) (3 results) (of which Overseas: 1 results)
光計測シンポジウム2016論文集
Volume: 23 Pages: 41-44
40021394458