Devlopment of a Novel Haptic Probe for Instrumented Indentation Microscope System
Project/Area Number |
26630326
|
Research Category |
Grant-in-Aid for Challenging Exploratory Research
|
Allocation Type | Multi-year Fund |
Research Field |
Inorganic materials/Physical properties
|
Research Institution | National Institute of Advanced Industrial Science and Technology |
Principal Investigator |
Miyajima Tatsuya 国立研究開発法人産業技術総合研究所, 構造材料研究部門, 主任研究員 (10358129)
|
Project Period (FY) |
2014-04-01 – 2017-03-31
|
Project Status |
Completed (Fiscal Year 2016)
|
Budget Amount *help |
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2015: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
Fiscal Year 2014: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
|
Keywords | ナノマイクロ構造解析・評価・試験法 / インデンテーション / 力学物性 / 圧子 / 押し込み試験 |
Outline of Final Research Achievements |
A novel sensing technique for the instrumented indentation microscope is proposed for characterizing the mechanical properties of materials in nano/micro regimes by the use of scanning probe microscope. The key issue of this technique is determining the back-face displacement profile (BDP) of the novel multifunctional haptic indenter during indentation contact in situ. The finite element analysis (FEA) is utilized for that scanning probe microscope is capable of determining in a quantitative manner the back-face displacement profile of the haptic indenter.
|
Report
(5 results)
Research Products
(8 results)