| Project/Area Number |
26630330
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Composite materials/Surface and interface engineering
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| Research Institution | Japan Advanced Institute of Science and Technology |
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Principal Investigator |
Tomitori Masahiko 北陸先端科学技術大学院大学, 先端科学技術研究科, 教授 (10188790)
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| Project Period (FY) |
2014-04-01 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2016: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2015: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2014: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
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| Keywords | 走査プローブ顕微鏡 / 表面・界面物性 / 電荷移動 / エネルギー散逸 / 分子計測 |
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| Outline of Final Research Achievements |
Scanning probe microscopy (SPM) has successfully contributed to the evolution of nanotechnology and nanoscience, which provides us with surface topographic images, including nanoscale surface properties, of a great number of materials by approaching an atomically-sharpened tip to the sample surface. Nowadays, the further developments of SPM are intensively expected in regard to the nanoscale surface characterization. In this study, we improved the sensitivity of mechanical dissipation energy in a non-contact atomic force microscopy (nc-AFM) system, and installed a wide-band charge amplifier (CA) to the system, in order to extend the potential of the nanoscale characterization of nc-AFM. Atomic-scale capacitance and contact potential difference between the nc-AFM tip and a Si(111)-7×7 surface were analyzed, as a demonstration. CA maps exhibited atomic-scale contrast at a fast scanning rate, indicating the usefulness of our developed methods.
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