Development of Precise and Practicable Evaluation Criteria and Improvement Method for Web Application Testing

• Project/Area Number: 26730043
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Multi-year Fund
• Research Field: Software
• Research Institution: National Institute of Informatics
• Principal Investigator: Sakamoto Kazunori 国立情報学研究所, 大学共同利用機関等の部局等, 特任助教 (60609139)
• Project Period (FY): 2014-04-01 – 2017-03-31
• Project Status: Completed (Fiscal Year 2016)
• Budget Amount: ¥3,640,000 (Direct Cost: ¥2,800,000、Indirect Cost: ¥840,000); Fiscal Year 2016: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000); Fiscal Year 2015: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000); Fiscal Year 2014: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
• Keywords: ソフトウェアテスト / テストカバレッジ / テストオラクル / Webアプリケーション / スクレイピング / 情報抽出 / テストケース評価指標 / HTML文書の差分計算 / 動的部分

Outline of Final Research Achievements

The purpose of this study is to tackle the problem where Web applications frequently change and the development and maintenance costs of Web application tests are high. To achieve the purpose, we found that the PageObjects design pattern could improve the maintainability of Web application tests, and then, we developed a novel Web testing framework named DePoT including a new internal domain specific language for helping developers to employ the PageObjects design pattern. We evaluated DePoT and found that DePoT could reduce the development and maintenance costs of Web application tests. In addition, we successfully developed a new test input generation techniques named Feedback-controlled Random Test Generation and a new extraction method for Web pages as application studies.

Research Products

• [Journal Article] DePoT：Webアプリケーションテストにおけるテストコード自動生成テスティングフレームワーク (2015)
  • Author(s): 青井翔平, 坂本一憲, 鷲崎弘宜, 深澤良彰
  • Journal Title: 情報処理学会論文誌 Volume: 56 Pages: 835-846
  • NAID: 110009884075
  • Peer Reviewed / Acknowledgement Compliant
• [Presentation] Feedback-Controlled Random Test Generation (2015)
  • Author(s): Kohsuke Yatoh, Kazunori Sakamoto, Fuyuki Ishikawa, Shinichi Honiden
  • Organizer: ISSTA '15: ACM International Symposium on Software Testing and Analysis
  • Place of Presentation: Baltimore, Maryland
  • Year and Date: 2015-07-14
  • Int'l Joint Research
• [Remarks] 産学連携で研究成果を社会実装へ/アーキテクチャ科学研究系 坂本一憲助教のweb情報抽出技術
  • URL: http://www.nii.ac.jp/news/release/2017/0208-1.html
• [Remarks] 国立情報学研究所のweb情報抽出技術に関する研究開発に参画して研究成果を事業化
  • URL: http://rooter.jp/news/2017/nii_release.html