Development of spatially-time-resolved single-shot pulse radiolysis
Project/Area Number |
26820406
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Research Category |
Grant-in-Aid for Young Scientists (B)
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Allocation Type | Multi-year Fund |
Research Field |
Nuclear engineering
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Research Institution | Osaka University |
Principal Investigator |
Gohdo Masao 大阪大学, 産業科学研究所, 特任研究員 (60705094)
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Project Period (FY) |
2014-04-01 – 2016-03-31
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Project Status |
Completed (Fiscal Year 2015)
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Budget Amount *help |
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2015: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2014: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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Keywords | パルスラジオリシス / 放射線化学 / 時間分解分光 / 超高速分光法 / シングルショット測定 / 吸光度測定 / 放射腺化学 / 超高速反応 |
Outline of Final Research Achievements |
To investigate a primary process of ionizing radiation induced chemical reaction, novel measurement technique of pulse radiolysis, “spatially time-resolved single-shot pulse radiolysis” was proposed and developed. This new technique achieved based on conversion of the information of irradiated location in the sample to the information of transient absorption at the corresponding time by introducing ultra-short electron beam and probe light pulse from fs-laser. The spatially time-resolved single-shot pulse radiolysis technique enables us to obtain 100 ps time window by one-shot measurement and expected to accelerate investigation of dynamics of a primary reaction of radiation chemistry.
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Report
(3 results)
Research Products
(21 results)
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[Journal Article] Measurement of <20 fs bunch length using coherent transition radiation2014
Author(s)
I. Nozawa, K. Kan, J. Yang, A. Ogata, T. Kondoh, M. Gohdo, K. Norizawa, H. Kobayashi, H. Shibata, S. Gonda, and Y. Yoshida
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Journal Title
Phys. Rev. ST Accel. Beams
Volume: 17
Issue: 7
Pages: 072803-072803
DOI
Related Report
Peer Reviewed / Open Access
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[Journal Article] Femtosecond Pulse Radiolysis2014
Author(s)
近藤孝文,楊金峰,菅晃一,神戸正雄,柴田裕実,吉田陽一
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Journal Title
IEEJ Transactions on Electronics, Information and Systems
Volume: 134
Issue: 5
Pages: 664-669
DOI
NAID
ISSN
0385-4221, 1348-8155
Related Report
Peer Reviewed / Open Access
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