Physical Properties of a new Low-dimensional Conductor HfTes
| Project/Area Number |
57460020
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| Research Category |
Grant-in-Aid for General Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
固体物性
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| Research Institution | University of Tsukuba |
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Principal Investigator |
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| Project Period (FY) |
1982 – 1988
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| Project Status |
Completed (Fiscal Year 1988)
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| Budget Amount *help |
¥7,900,000 (Direct Cost: ¥7,900,000)
Fiscal Year 1983: ¥1,400,000 (Direct Cost: ¥1,400,000)
Fiscal Year 1982: ¥6,500,000 (Direct Cost: ¥6,500,000)
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| Keywords | Low-dimensional Conductor / Pulsed high-magnetic field / Shubnikov-de Haas effect / Fermi surface / 低温X線構造解析(17K) |
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| Research Abstract |
The transition-metal pentatellurides ZrTe_5 and HfTe_5 have been attracting the interest in the field of low-dimensional conductors. We found out a strong electrical resistivity peak around 70 K in HfTe_5 for the first time and we also obtained a clue to synthesize single crystals of impurity-free HfTe_5. The purpose of this research project is to study its fruitful physical properties as far as possible by various experiments and to clarify the origin of the resistivity peak in HfTe_5.
[1982-1983] with respect to the origin of the resistivity peak, the measurements of magnetoresistance, Hall coefficient and resistance under the pulsed magnetic field up to 42 T have been intensively done together with magnetization study below the temperature of the resistivity peak. As the result the long cigarette shaped ellipsoidal Fermi surfaces of HfTe_5 and ZrTe_5 were determined by the observed Shubnikov-de Haas oscillation. The anisotropic conductivity was explained semi-quantitatively by using the obtained transport parameters.
[1984-1986] On the other hand we have performed the intensive study of single crystal X-ray diffraction down to 7 K by using four-circle X-ray diffractometer. Especially, the determination of the crystal structure of HfTe_5 at 17 K was carried out and its result was compared with the crystal structure at room temperature. In the present X-ray study, no remarkable lattice displacement was observed in HfTe_5 between 17 K and room temperature.
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Report
(1 results)
Research Products
(12 results)
