| Project/Area Number |
59850117
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| Research Category |
Grant-in-Aid for Developmental Scientific Research
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| Allocation Type | Single-year Grants |
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| Research Field |
金属材料(含表面処理・腐食防食)
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| Research Institution | Institute of Industrial Science, University of Tokyo |
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Principal Investigator |
YOICHI ISHIDA Institute of Industrial Science, University of Tokyo, 生産技術研究所, 教授 (60013108)
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| Co-Investigator(Kenkyū-buntansha) |
小久保 靖 日本電子株式会社, 技術部, 主任研究員
HIDEKI ICHINOSE Institute of Industrial Science, University of Tokyo, 生産技術研究所, 助手 (30159842)
MINORU MORI Institute of Industrial Science, University of Tokyo, 生産技術研究所, 助教授 (30134646)
SUSUMU NANAO Institute of Industrial Science, University of Tokyo, 生産技術研究所, 助教授 (60013231)
MORIO ONOE Institute of Industrial Science, University of Tokyo, 生産技術研究所, 名誉教授 (70013076)
YASUSHI KOKUBO Japan Electron Optics Laboratory LTD
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| Project Period (FY) |
1984 – 1986
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| Project Status |
Completed (Fiscal Year 1986)
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| Budget Amount *help |
¥14,000,000 (Direct Cost: ¥14,000,000)
Fiscal Year 1986: ¥500,000 (Direct Cost: ¥500,000)
Fiscal Year 1985: ¥2,900,000 (Direct Cost: ¥2,900,000)
Fiscal Year 1984: ¥10,600,000 (Direct Cost: ¥10,600,000)
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| Keywords | transmission electron microscopy / three-dimensional analysis / computer tomography / image analysis / 弱ビーム像 / 透過電子顕微鏡 / 画像処理システム / 3次元組織 / 立体観察 / 粒界並進成分 |
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| Research Abstract |
Application of computer tomography to three dimensional analysis of internal structures in a thin foil specimen by combining an image analyser to a transmission electron microscope is the objective of this research. A high voltage electron microscope of the University was used and special computer programs were produced to do the analysis. As for the specimens (1) a splat-cooled Al-Sn alloy with small spherical <bata> -Sn particles dispersed in Al matrix, (2) doped GaP single crystal with a characteristic dislocation network, (3) stainless steels with defect introduced by either helium ion irradiation or hydrogen charging and (4) tritium transmission electron microscopic autoradiography specimen. The last two subjects are basic researches related to the development of fusion reactor first wall material. In all cases a set of photographs were taken for a same area tilting the specimen foil by a side-entry type goniometer by <-!+> 60 degrees and marking representative points by a digitizer. On-line analysis was delayed because of the problems in using the high voltage electron microscope of the University. As the bases of the present project, several analysis techniques (1) crystalline orientation relationship representation, (2) weak-beam common diffraction method and (3) image analysis of weak-beam, lattice image and channeling pattern were developed. Weak-beam imaging is particularly useful for the present analysis because localized and high contrast images are obtained for a set of micrographs at a single diffraction if the tilting axis was made approximately parallel to that of the side entry goniometer. Analysis of fine interface structures by a common diffraction ( <alpha> -fringe) is a favorable subject of the method and number of works were published in this area, the copies of which are included in the report.
Lattice Imaging Analysis of <SIGMA> 3 Coincidence-site-lattice Boundaries
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