Application of image-intensifier for the development of the direct observation of weak images of electron-microscope

Research Project

Project/Area Number	59880006
Research Category	Grant-in-Aid for Developmental Scientific Research
Allocation Type	Single-year Grants
Research Field	結晶学
Research Institution	Faculty of Science, University of Tokyo
Principal Investigator	TOKONAMI Masayasu Faculty of Science, University of Tokyo, 理学部, 教授 (80029850)
Co-Investigator(Kenkyū-buntansha)	OZAWA Tohru Faculty of Science, University of Tokyo, 理学部, 講師 (00011651) TAKEDA Hiroshi Faculty of Science, University of Tokyo, 理学部, 教授 (50011523)
Project Period (FY)	1984 – 1986
Project Status	Completed (Fiscal Year 1986)
Budget Amount *help	¥4,200,000 (Direct Cost: ¥4,200,000) Fiscal Year 1986: ¥300,000 (Direct Cost: ¥300,000) Fiscal Year 1985: ¥400,000 (Direct Cost: ¥400,000) Fiscal Year 1984: ¥3,500,000 (Direct Cost: ¥3,500,000)
Keywords	electron microscopy electron-microscope / in situ observation / microchannel plate / MCP / MCP / 画像記録 / 電子線照射量
Research Abstract	Electron-microscopy has provided information on a wide variety of materials problems. With the availability of electron-microscopes with a high-resolution its field of application has been extended greatly. In recent years, "in situ" observation of various phenomena within the specimen holder has caught the interest of many investigators, where bright images with a high resolution are indispensable. Cases are also often met with, which we can obtain only considerably thick specimens. In each case, we need such a strong radiation of electron beam or a long exposure time to record pictures on conventional films as the specimens are in danger of being totally damaged. There are also another cases the specimen essentially suffer serious damage even by fairly weak irradiation. It was the purpose of the present investigation to develop a system suitable for obtaining bright images with high contrast using only a weak electron beam by containing a microchannel plate (MCP), the quality of which has been rapidly augmented, into the electron-microscope. A set of mount and flange has been specially designed in order to include the MCP into the electron-microscope. Furthermore, a high-sensitive TV camera, a video tape recorder and a personal computer have been arranged in line with the total planning. In the last result of the present investigation, we could reduce the total amount of the radiation of electron beam to around 1/50 compared with the conventional technique to record the same picture. The effect of the electron amplification of the MCP has brought a marked increase in the brightness and a distinct improvement in the resolution of the whole system. Hence our present purpose has been successfully achieved.