| Project/Area Number |
60302051
|
|---|
| Research Category |
Grant-in-Aid for Co-operative Research (A)
|
| Allocation Type | Single-year Grants |
|---|
| Research Field |
船舶構造・建造
|
|---|
| Research Institution | Yokohama National University |
|---|
Principal Investigator |
ITAGAKI Hiroshi Yokohama Natinal University, 工学部, 教授 (10017882)
|
|---|
| Co-Investigator(Kenkyū-buntansha) |
ISHIZUKA Tetsuo Yokohama Natinal University, 工学部, 助手 (50017927)
ISHIKAWA Hiroshi Kagawa University, 経済学部, 助教授 (60026200)
MACHIDA Susumu University of Tokyo, 工学部, 教授 (70010692)
|
|---|
| Project Period (FY) |
1985 – 1986
|
| Project Status |
Completed (Fiscal Year 1986)
|
| Budget Amount *help |
¥9,900,000 (Direct Cost: ¥9,900,000)
Fiscal Year 1986: ¥2,300,000 (Direct Cost: ¥2,300,000)
Fiscal Year 1985: ¥7,600,000 (Direct Cost: ¥7,600,000)
|
|---|
| Keywords | random fatigue / crack growth rate / micro-computer / FFT program |
|---|
| Research Abstract |
To supply data needed for a rational fatigue design of structures subject to random load there must be some approp riate testing methods which are able to reproduce a specified time history of the random variable such as load, stress, strain and stress intensity factor and also must be inexpensive to be popular ones.
With a small micro conmputer system alone, it is very difficult to perform exact experiments considering the dynamic characters of the test system varying as the fatigue damage accumulates in the specimen.
In this report, two Micro Processing Units are used to perform experiments with or without resposnse compensation by FFT. Stationary Gaussian random processes are generated with a large computer and data are packed into special forms to be sent through TSS within a reasonable time. A micorcomputer program which generates stationary Gaussian Random Process is also developed.
The developed soft and hardware are satisfactory and fatigue crack growth tests under a stationary random stress intensity factor showed the effect of the compensation and indicated the possiblility of a simplified and less time consuming test method without resposnse compensation.
|
