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Design of a low background mass spectromenter for a high sensitive analytical ion microscope

Research Project

Project/Area Number 60840024
Research Category

Grant-in-Aid for Developmental Scientific Research

Allocation TypeSingle-year Grants
Research Field 鉱物学(含岩石・鉱床学)
Research InstitutionNaruto University of Education (1986-1987)
Osaka University (1985)

Principal Investigator

NISHIMURA Hiroshi  Naruto University of Education, Associate %professor, 学校教育学部, 助教授 (30029722)

Co-Investigator(Kenkyū-buntansha) OKNANO Jun  Osaka University, Prodessor, 教養部, 教授 (10028087)
Project Period (FY) 1985 – 1987
Project Status Completed (Fiscal Year 1987)
Budget Amount *help
¥11,100,000 (Direct Cost: ¥11,100,000)
Fiscal Year 1987: ¥700,000 (Direct Cost: ¥700,000)
Fiscal Year 1986: ¥700,000 (Direct Cost: ¥700,000)
Fiscal Year 1985: ¥9,700,000 (Direct Cost: ¥9,700,000)
Keywordsmass spectrometer / ion microscope / isotope analysis / 同位体比 / IMA / SIMS / 同位体異常
Research Abstract

The design of a double fousing mass spcectrometer has been attempted as a part of a highly sensitive analytical ion microscope for the isotope analysis of solid samplesd. It has the follwoing capabilities; (1) high mass resolbing power of about 3200, (2) high sensitivity with a wide dynamic range of 5 orders of magnitude and (3) high accuracy of measurement of about (+-)0.5%. We calcuated the ion optical parameters of the mass spectrometer using "the program for a personal computer" by Matsuda (1983) in the journal of Mass Spectroscopy. The results of the calculation is as follows; electric field: 75゜ in deflection angle and 40cm in rafidus, magnetic field: 90゜ in deflection angle and 20cm in radius and mass resolving power: 3400 2( 100um width of a collector slit. Based on this design, An analyzer chamber, an electro-matnet, a momwntum analyzer and its chamber wete constructed. A controlling circuit for evacuation system has been designed and consttucted, this can be connected to a personal computer through an interface and relays.
These were tested for vaclum and the ultimate pressure of the system ha benn attained to be about 1 X 10^<-7> Torr without any baking of the chambe. As for an electro-magnet, magnetic field at the cenger of of pole pieces was found to be able to sweep over the trange 0-5000 Gauss. This range corresponds to the mass range of 0-250 at an ion accelecrating voltage of 2kV.
Therfore, this double focusing mass spectrometer can be used as a detector of a highly sensitive analytical ion microscope.

Report

(3 results)
  • 1987 Final Research Report Summary
  • 1986 Annual Research Report
  • 1985 Annual Research Report
  • Research Products

    (17 results)

All Other

All Publications (17 results)

  • [Publications] 西村 宏: 学術月報. 40. 70 (1987)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] H.Nishimura: Secomdary Ion Mass Spectrometry (SIMS VI)(ed. by A.Benninghoven et al.). (1988)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] H.Sakaguchi: Mass Spectroscopy. 36. (1988)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] H.Nishimura: Mass Spectroscopy. (1988)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] 久米昭一,諏訪兼位,岡野 純,小泉 格,西村 宏: "地球:との実像" 学術図書出版, (1988)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] Hiroshi Nishimura: "Design of a low backgournds mass spectrometer for a high sensitive analytical ion microscope" Japanaece Scientific Monthly. 40. 70 (1987)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] Hiroshi Nishimura: "Isotopic abundances of iron determined by SIMS" Secondary ion Mass Spectrometry (SIMS vL) (ed. by A. Benninghoven er al.). (1988)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] Hitomi Sakaguchi: "Ion microprobe and electron microprode studies on magfnesium isotopic abundances in olivice minerals from aht Allende carbonaceous chondrite" Mass Spectroscopy. 36. (1988)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] Hiroshi Nishimura: "Isotopic abundances of germanium determined by secondary ion mass spectrometry" Mass Spcetrometry. (1988)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] Hiroshi Nishimura (with S.Kuma, K.Suwa, J. okano and I. Koizumi): Gakujutsu Tosho Shuppan Co.The Earth (%Section 2), (1988)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1987 Final Research Report Summary
  • [Publications] J.Okano;T.Ochiai;H.Nishimura: Appl.Surf.Sci.22/23. 72-81 (1985)

    • Related Report
      1986 Annual Research Report
  • [Publications] J.Okano;C.Ueda;H.Nishimura: Mass Spectroscopy. 33. 245-253 (1985)

    • Related Report
      1986 Annual Research Report
  • [Publications] J.Okano;H.Nishimura: Secondary Ion Mass Spectrometery(SIMS V),Springer Verlag. 447-450 (1986)

    • Related Report
      1986 Annual Research Report
  • [Publications] 西村宏: 学術月報(日本学術振興会). (1987)

    • Related Report
      1986 Annual Research Report
  • [Publications] Applications of Surface Science. 22/23. (1985)

    • Related Report
      1985 Annual Research Report
  • [Publications] 貭量分析(Mass Spectroscopy). 33-4. (1985)

    • Related Report
      1985 Annual Research Report
  • [Publications] Secondary Ion Mass Spectrometry(SIMS【IV】)Springer Ver. (1986)

    • Related Report
      1985 Annual Research Report

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Published: 1987-03-31   Modified: 2016-04-21  

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