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White X-ray Topographs using a small and brilliant high energy source

Research Project

Project/Area Number 60850119
Research Category

Grant-in-Aid for Developmental Scientific Research

Allocation TypeSingle-year Grants
Research Field Physical properties of metals
Research InstitutionFaculty of Engineering, Hokkaido University

Principal Investigator

SATO Shin'ichi  Department of Applied Physics, Faculty of Engineering, Hokkaido University , Prof., 工学部, 教授 (80001121)

Project Period (FY) 1985 – 1986
Project Status Completed (Fiscal Year 1986)
Budget Amount *help
¥8,700,000 (Direct Cost: ¥8,700,000)
Fiscal Year 1986: ¥1,700,000 (Direct Cost: ¥1,700,000)
Fiscal Year 1985: ¥7,000,000 (Direct Cost: ¥7,000,000)
KeywordsX-ray diffraction topography / Transmission topograph / Schulz technique / Diffraction contrast / Lattice defects
Research Abstract

The Lang's method is the most popular and widely used technique of transmission X-ray topography. However, characteristic X-ray is used in this technique and therefore one has to prepare a thin specimen to get clear topographs especially for materials with heavy atoms.
In the present study, we planned to use strong and hard white X-rays emitted from a high power X-ray generator in Hokkaido University. First of all, we tried to produce a specially designed electron gun for a fine focussing X-ray source, since the size of source shoud be as small as possible in the topography using white X-rays. The newly designed gun has double Wehnelt covers, inner and outer, which are insulated each other, the bias voltage being applied independently. The distance between the covers as well as between the target and covers can be adjusted without difficulty. After repeating examinations to minimize the focussing size many times over, we finally obtained a minimum size of 0.08mmX0.90mm, excluding subsidiary focussed intensities. Next, the transmission topographs were taken for thick single crystal plates with heavy atoms, such as Ge, Zn, Cu, Fe, GaAs, InP, CdTe etc,, by using hard and strong white X-ray emitted from the above stated brilliant source. The geometry of X-ray optics was critically studied on the basis of the image resolution and moreover filters with optimum thicknesses for various materials were searched. It was successfully recognized that the white X-ray topograph taken for thick specimens possesses high enough quality, as well as the Lang topographs so far taken for thin specimens.

Report

(2 results)
  • 1986 Final Research Report Summary
  • 1985 Annual Research Report
  • Research Products

    (14 results)

All Other

All Publications (14 results)

  • [Publications] 佐藤進一: 日本金属学会報. 23. 631-632 (1984)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] 高間俊彦,小林一介,佐藤進一: 北大工学部研究報告(応用物理学科設立20周年号). 125. 181-189 (1985)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] 高間俊彦,土谷浩一,小林一介,佐藤進一: 北大高エネルギー超強力X線回折室年報. 2. 18-21 (1985)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] 高間俊彦,佐藤進一: 日本金属学会報. 24. 905-913 (1985)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] 高間俊彦,小林一介,土谷浩一,東野俊一,佐藤進一: 北大高エネルギー超強力X線回折室年報. 3. 15-18 (1986)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] K.Kobayashi;T.Takama;S.Sato: Japanese J.Apllied Physics.

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] S. Sato: "Transmission White X-ray Topography" Bulletin of the Japan Institute of Metals. 23. 631-632 (1984)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] T. Takama, K. Kobayashi and S. Sato: "A Lately Developed Technique Precisely Measuring Structure Factors -Pendellosung Method Using White Radiation-" Bulletin of the Faculty of Engineering, Hokkaido University. 125. 181-189 (1985)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] T. Takama, K. Tsuchiya, K. Kobayashi and S. Sato: "X-ray Atomic Scattering Factors of Carbon in Synthetic Diamond Crystals" Annual Report of the High Brilliance X-ray Laboratory, Hokkaido University. 2. 18-21 (1985)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] T. Takama and S. Sato: "Use of Hard White X-rays in the Diffraction Study" Bulletin of the Japan Institute of Metals. 24. 905-913 (1985)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] T. Takama, K. Kobayashi, K. Tsuchiya, S. Tohno and S. Sato: "A Precise Measurement of Structure Factors of InP" Annual Report of the High Brilliance X-ray Laboratory, Hokkaido University. 3. 15-18 (1986)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] K. Kobayashi, T. Takama and S. Sato: "Determination of the Structure Factors of GaAs by the Pendellosung Beat Measurements Using White Radiation" To be published in Japanese J. of Appl. Phys.

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1986 Final Research Report Summary
  • [Publications] 北大工学部研究報告. 125-号. (1985)

    • Related Report
      1985 Annual Research Report
  • [Publications] 日本金属学会報. 24巻-11号. (1985)

    • Related Report
      1985 Annual Research Report

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Published: 1987-03-31   Modified: 2016-04-21  

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