| Budget Amount *help |
¥1,700,000 (Direct Cost: ¥1,700,000)
Fiscal Year 1987: ¥300,000 (Direct Cost: ¥300,000)
Fiscal Year 1986: ¥1,400,000 (Direct Cost: ¥1,400,000)
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| Research Abstract |
The purpose of the investigation is to analyze the correlation between the tracking resistance to tracking and the noise which is piled up on the fundamental wave(AC 240 V) using a test method similar to the IEC tracking test. On the basis of these experimental results, the mechanisma and processes of tracking failure, The effects of noise on the comparative tracking indices(CTI) and the scatter of data were discussed. The results can be summarized as follows. (1) The CTI by applying of the intermittent AC voltage was smaller than that by applying of the continuous AC voltage. The resistance to tracking was accelerated by the noise. (2) For the noise voltage of having a 90゜ phase applied, the tracking failure was accelerated as the noise value increased within the value was 1kV. Any further incresed in the noise voltage, the number of drops to tracking failure incresed, and the standard deviation became large. (3) The scintillations occurred within the noise value was 1 kV, while the glow discharges occurred over 1.3 kV. (4) The tracking failure was accelarated by the heat of scintillation. On the other hand, the glow discharges did not take part in the tracking failure. (5) In the case of the noise voltage of having a 30゜ phase, the number of drops to tracking failure decreased in the noise value of 0.9 kV, and the scatter became constant. (6) When the noise voltage was 0.5 kV and the phases were varied, the number of drops to tracking failure depended on the phase, and the tracking failure was accelerated by the positive noise on the fundamental wave. On the other hand, the number of drops incresed at the test condition of the negative noise voltage of having 270゜ phase.
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