|Budget Amount *help
¥4,100,000 (Direct Cost: ¥4,100,000)
Fiscal Year 1987: ¥2,000,000 (Direct Cost: ¥2,000,000)
Fiscal Year 1986: ¥2,100,000 (Direct Cost: ¥2,100,000)
The infrared emission spectra were discussed with the change of sample surface temperature. The temperature of surface sample was respectivelyh controlled by using Pelitier Effect for 60゜, 40゜, 20゜, and 10゜C. This temperature control system was assembled by the thermo-moduale (Melcor Japan Co.LTD.) equipped with 214 PID direct- current power supply ( (SHIN NIPPON DENKO Co.LTD.,), setted on the out side sample position of TTS-15 FTIR(Digilab). The back side of the thermo-module was cooled by water or ice water. The samples were diocthylphthalate and polymethylmethacryrate (PMMA) on Alminum foil or tharmo-module The higher temperature. the stronger intensity of emission band was made. The band intensity of 60゜C Is for times as stronger as the spectrum of 40゜C. When the temparature was lower than that of beam-splitter, for example 20゜C, the direction of the bands were turned, furthermore,the intensities were increased at the 10゜C. The spectra of low temperature were coused by the rfeflection of beam splitter radiation from metal substrate of sample system. Therefore the spectra were coresponded to two times transmission of surface layer. So, more sensitive emission spectra may be obtained by correcting of the reflection component when the spectra are measured by more higher temperature than the beam splitter. The spectra of PMMA on ceramic (the surface of thermo-module) were measured . at 60゜ and 10゜C , the spectra were discussed with the transmission spectrum of ceramic that shown the broad band at the 1000 cm-1 region. The band of 1725 cm of PMMA was made clear but 1150 cm emission band that is almost directry together with the ceramic band was disappeared. On the-contrary, the 1725 cm band was in opposite direction, and 1150 cm was detected as emission band at 10゜C. In the results, spectra of organic layer on ceramic is possible to obtain by mutural correction with both higher and lower sample temperature than beam splitter.