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Scanning capacitance decimicron microscope

Research Project

Project/Area Number 62550288
Research Category

Grant-in-Aid for General Scientific Research (C)

Allocation TypeSingle-year Grants
Research Field 電子機器工学
Research InstitutionOsaka University

Principal Investigator

TAMURA Shinichi  Osaka University Medical School (Professor), 医学部, 教授 (30029540)

Co-Investigator(Kenkyū-buntansha) TOKUTAKA Heizo  Faculty of Engineering, Tottori University (Professor), 工学部, 教授 (70032266)
YAMANAKA Masanobu  Faculty of Engineering, Osaka University (Associate Professor), 工学部, 助教授 (10029118)
Project Period (FY) 1987 – 1988
Project Status Completed (Fiscal Year 1988)
Budget Amount *help
¥1,900,000 (Direct Cost: ¥1,900,000)
Fiscal Year 1988: ¥800,000 (Direct Cost: ¥800,000)
Fiscal Year 1987: ¥1,100,000 (Direct Cost: ¥1,100,000)
KeywordsElectro-static capacitance / Microscope / VHD / Imaging / Piezoelectric actuator / Slightly-moving-stage / STM
Research Abstract

In this research, the object surface is scanned with a micro-capacitance probe (stylus) and piezoelectric actuator such as PZT two-dimensionally or 2.5-dimensionally, and its capacitance variat ion is visualized as an image. The system is devised as follows:
1) Driving method: since there are two kinds of driving mechnism of stage-driving and stylus-driving, both methods are tested for comparison. Then, we got a conclusion that the stylus-driving method is better than the stage-driving. Therefore, we adopted a mechanism of driving XYZ the stylus directly by the piezoelectric actuators.
2) Coarse height adjustment mechanism: We set a micrometer for the coarse adjusting along the hight. Further, we tried to set an oblieque optical microscope for confirming the stylus hight. Thus, we devised a mechanism for adjusting the hight of the stylus manually while confirming its hight with the optical microscope.
3) Fine hight driving mechanism: As a fine driving mechanism for scanning the object surface plane two-dimensionally, or scanning 2.5 dimensionally, we devised a driving mechanism with the piezoelect ric actuators according to the detected capacitance, that is detector output.
By these effort, it is proved that it is possible enough to realize the resolution power of 0.1mum. As yet, the reapeatability of the hight detection is high enough. However, the repeatability of of the lateral directions in lacking. The rough power of the present system is, resolution power : 0.1 mum+alpha, maximum scanning range: 20 mum x 20 mum, tip size of the capacitance sytlus is 0.1 mum x 0.1 mum, scanning time is 20 sec (20 mum x 20 mum) or 4 sec (5 mum x 5 mum). It should be discussed how to use the scanning capacitance microscope for the guide of the STM, and for the super high density memory (several ten times of optical disc).

Report

(3 results)
  • 1988 Annual Research Report   Final Research Report Summary
  • 1987 Annual Research Report
  • Research Products

    (15 results)

All Other

All Publications (15 results)

  • [Publications] 田村進一: 昭和63年電子情報通信学会春季全国大会シンポジウム. SBー2. (1-549)-(1-550) (1988)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1988 Final Research Report Summary
  • [Publications] 田村進一: 電子情報通信学会画像工学研究会/パターン認識・理解研究会. IE87ー123. 1-6 (1988)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1988 Final Research Report Summary
  • [Publications] 渡部博志: 昭和63年電気関係学会中国支部連合大会102321. 199-199 (1988)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1988 Final Research Report Summary
  • [Publications] 宮地臣一: 昭和63年度電気関係学会中国支部連合大会102322. 200-200 (1988)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1988 Final Research Report Summary
  • [Publications] S.Tamura; K.Okazaki; S.Miyaji; T.Kurokawa; Y.Fukui: "Scanning electro-static microscope: SCaM" Institute of Electronics, Information and Communication Engineers Japan Spring Convention Symposium, SB-2. 1-549 (1988)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1988 Final Research Report Summary
  • [Publications] S.Tamura; K.Okazaki; Y.Fukui; H.Tokutaka; M.Yamanaka: "Scanning decimicron microscope SCaM" Institute of Electronics, Information and Communication Engineers Japan Technical Report. IE87-123 and PRU87-109. 1-6 (1988)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1988 Final Research Report Summary
  • [Publications] H.Watanabe; T.Osoreda; S.Miyaji; K.Okazaki; Y.Fukui; H.Tokutaka; S.Tamura; M.Yamanaka: "Scanning electro-static microscope: SCaM(1) -- Repeatability in hight and lateral one dimensional directions --" Joint Conference on Electrical Society Chugoku Branch 102321. 199 (1988)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1988 Final Research Report Summary
  • [Publications] S.Miyaji; T.Osoreda; H.Watanabe; K.Okazaki; Y.Fukui; S.Tamura; H.Tokutaka; M.Yamanaka: "Scanning electro-static microscope: SCaM(1) -- Imaging by stylus driving method --" Joint Conference on Electrical Society Chugoku Branch 102322. 200 (1988)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1988 Final Research Report Summary
  • [Publications] 田村進一: 昭和63年電子情報通信学会春季全国大会シンポジウム. SB-2. (1988)

    • Related Report
      1988 Annual Research Report
  • [Publications] 田村進一: 電子情報通信学会画像工学研究会/パターン認識・理解研究会. IE87-123. 1-6 (1988)

    • Related Report
      1988 Annual Research Report
  • [Publications] 渡部博志: 昭和63年度電気関係学会中国支部連合大会102321. 199-199 (1988)

    • Related Report
      1988 Annual Research Report
  • [Publications] 宮地臣一: 昭和63年度電気関係学会中国支部連合大会102322. 200-200 (1988)

    • Related Report
      1988 Annual Research Report
  • [Publications] 田村進一: 昭和62年度電気四学会中国支部連合大会No. 112225. 267- (1987)

    • Related Report
      1987 Annual Research Report
  • [Publications] 田村進一: 昭和63年電子情報通信学会春季全国大会シンポジウム. (1988)

    • Related Report
      1987 Annual Research Report
  • [Publications] 田村進一: 電子情報通信学会画像工学研究会/パターン認識・理解研究会(共催;1988・3). (1988)

    • Related Report
      1987 Annual Research Report

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Published: 1987-04-01   Modified: 2016-04-21  

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