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Time-resolved observation of surface and interface structures

Publicly Offered Research

Project Area3D Active-Site Science
Project/Area Number 15H01044
Research Category

Grant-in-Aid for Scientific Research on Innovative Areas (Research in a proposed research area)

Allocation TypeSingle-year Grants
Review Section Science and Engineering
Research InstitutionTokyo Gakugei University

Principal Investigator

Voegeli Wolfgang  東京学芸大学, 教育学部, 助教 (90624924)

Project Period (FY) 2015-04-01 – 2017-03-31
Project Status Completed (Fiscal Year 2016)
Budget Amount *help
¥5,980,000 (Direct Cost: ¥4,600,000、Indirect Cost: ¥1,380,000)
Fiscal Year 2016: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2015: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
KeywordsX線反射率 / X線回折 / 表面・界面 / 物性実験 / 時分割測定 / X線反射率 / X線回折
Outline of Annual Research Achievements

In the present research, an instrument for time-resolved measurements of the specular X-ray reflectivity and surface X-ray diffraction was improved and applied to the observation of dynamical processes at surfaces and interfaces, with the goal to further understanding of the functionality of active sites. This instrument can simultaneously observe the in-situ structure on the atomic scale and the nanometer scale with a time resolution of seconds or less.
The first topic that was adressed in FY2016 was the investigation of processes occuring during the photoconversion of organic thin films, which is a promising method for organic device fabrication. The structural evolution during the photoconversion was clarified for two different organic semiconductor materials.
The second topic that was investigated was processes occurring at the interface between an ionic liquid and an electrode. Time-resolved experiments with different electrode surfaces were conducted.
The measurement method was improved by designing a new crystal bender for focusing the X-rays. Another important advance was the extension of the method to monochromatic X-rays, so that both high-brightness undulator X-ray sources and widely available laboratory X-ray sources can be used.

Research Progress Status

28年度が最終年度であるため、記入しない。

Strategy for Future Research Activity

28年度が最終年度であるため、記入しない。

Report

(2 results)
  • 2016 Annual Research Report
  • 2015 Annual Research Report
  • Research Products

    (13 results)

All 2017 2016 2015

All Journal Article (2 results) (of which Int'l Joint Research: 1 results,  Peer Reviewed: 2 results,  Acknowledgement Compliant: 2 results) Presentation (11 results) (of which Int'l Joint Research: 4 results)

  • [Journal Article] A quick convergent-beam laboratory X-ray reflectometer using a simultaneous multiple-angle dispersive geometry2017

    • Author(s)
      Wolfgang Voegeli, Chika Kamezawa, Etsuo Arakawa, Yohko F. Yano, Tetsuroh Shirasawa, Toshio Takahashi and Tadashi Matsushita
    • Journal Title

      Journal of Applied Crystallography

      Volume: 50 Issue: 2 Pages: 570-575

    • DOI

      10.1107/s1600576717002461

    • Related Report
      2016 Annual Research Report
    • Peer Reviewed / Int'l Joint Research / Acknowledgement Compliant
  • [Journal Article] Dynamical Response of the Electric Double Layer Structure of the DEME-TFSI Ionic Liquid to Potential Changes Observed by Time-Resolved X-ray Reflectivity2016

    • Author(s)
      W. Voegeli, E. Arakawa, T. Matsushita, O. Sakata, Y. Wakabayashi
    • Journal Title

      Zeitschrift fuer Physikalische Chemie

      Volume: 230 Issue: 4 Pages: 577-585

    • DOI

      10.1515/zpch-2015-0669

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Presentation] Dispersive X-ray Scattering Measurements Using Monochromatic Undulator Radiation: Towards Millisecond Time Resolution2017

    • Author(s)
      Voegeli Wolfgang, 荒川悦雄, 高橋敏男, 白澤徹郎, 田尻寛男, 松下正
    • Organizer
      日本物理学会 第72回年次大会
    • Place of Presentation
      大阪大学(大阪府・豊中市)
    • Year and Date
      2017-03-17
    • Related Report
      2016 Annual Research Report
  • [Presentation] Quick surface/interface X-ray scattering measurements using monochromatic undulator radiation2017

    • Author(s)
      W. Voegeli,荒川悦雄,高橋敏男,白澤徹郎,田尻寛男,松下正
    • Organizer
      第30回日本放射光学会年会・放射光科学合同シンポジウム
    • Place of Presentation
      神戸芸術センター(兵庫県・神戸市)
    • Year and Date
      2017-01-07
    • Related Report
      2016 Annual Research Report
  • [Presentation] Time-Resolved X-ray Scattering Observation of the Photoconversion of Pentacene Diketone Films to Pentacene2017

    • Author(s)
      W. Voegeli,荒川悦雄,高橋敏男,白澤徹郎,鈴木充朗,山田容子,松下正
    • Organizer
      第30回日本放射光学会年会・放射光科学合同シンポジウム
    • Place of Presentation
      神戸芸術センター(兵庫県・神戸市)
    • Year and Date
      2017-01-07
    • Related Report
      2016 Annual Research Report
  • [Presentation] In-situ observation of the photoconversion of organic thin films2016

    • Author(s)
      Voegeli Wolfgang, 荒川悦雄, 白澤徹郎, 鈴木充朗, 山田容子, 高橋敏男, 松下正
    • Organizer
      日本物理学会 2016年秋季大会
    • Place of Presentation
      金沢大学(石川県・金沢市)
    • Year and Date
      2016-09-13
    • Related Report
      2016 Annual Research Report
  • [Presentation] Quick thin film/multilayer characterization using convergent-beam X-ray scattering measurements2016

    • Author(s)
      Wolfgang VOEGELI, Chika KAMEZAWA, Hirokazu SAITO, Etsuo ARAKAWA, Tetsuroh SHIRASAWA, Toshio TAKAHASHI, Yohko F. YANO, Yumiko TAKAHASHI, Tadashi MATSUSHITA
    • Organizer
      20th International Vacuum Congress
    • Place of Presentation
      Busan Exhibition Convention Center (Busan・韓国)
    • Year and Date
      2016-08-21
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research
  • [Presentation] In-Situ Observation of the Structural Evolution During the Anodic Oxidation of Silicon2016

    • Author(s)
      W. Voegeli, E. Arakawa, T. Shirasawa, T. Matsushita
    • Organizer
      The 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18)
    • Place of Presentation
      Nagoya Congress Center (Nagoya・Japan)
    • Year and Date
      2016-08-07
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 単色アンジュレータ光を用いた多角度同時分散型反射率計2016

    • Author(s)
      フォグリ ヴォルフガング,白澤徹郎,荒川悦雄,齋藤広和,松下正
    • Organizer
      第29回日本放射光学会年会・放射光科学合同シンポジウム JSR2016
    • Place of Presentation
      東京大学柏の葉キャンパス駅前サテライト(つくば)
    • Year and Date
      2016-01-09
    • Related Report
      2015 Annual Research Report
  • [Presentation] Anodic Oxidation of Silicon Observed In-Situ by Specular X-ray Reflectivity2015

    • Author(s)
      Wolfgang Voegeli, E. Arakawa, C. Kamezawa, R. Iwami, T. Shirasawa and T. Matsushita
    • Organizer
      ALC '15, 10th International Symposium on Atomic Level Characterizations for New Materials and Devices '15
    • Place of Presentation
      Kunibiki Messe (Matsue, Japan)
    • Year and Date
      2015-10-25
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] An asymmetric crystal polychromator with a wide wavelength range for time-resolved surface diffraction measurements2015

    • Author(s)
      Voegeli Wolfgang,白澤徹郎,荒川悦雄,松下正
    • Organizer
      日本物理学 2015会秋季大会
    • Place of Presentation
      関西大学 千里山キャンパス(大阪)
    • Year and Date
      2015-09-16
    • Related Report
      2015 Annual Research Report
  • [Presentation] 逆格子マップおよびX線反射率曲線の迅速測定法ーin situ測定を目指してー2015

    • Author(s)
      松下 正、Voegeli Wolfgang
    • Organizer
      イノベーション ジャパン2015
    • Place of Presentation
      東京ブッグサイト(東京)
    • Year and Date
      2015-08-27
    • Related Report
      2015 Annual Research Report
  • [Presentation] Observation of irreversible structural changes of surfaces and thin films with time-resolved X-ray reflectivity and diffraction2015

    • Author(s)
      Wolfgang Voegeli, Etsuo Arakawa, Tetsuroh Shirasawa, Toshio Takahashi, Yohko F. Yano, Tadashi Matsushita
    • Organizer
      588. WE-Heraeus-Seminar on 'Element Specific Structure Determination in Materials on Nanometer and Sub-Nanometer'
    • Place of Presentation
      Conference Centre of the German Physical Society(ドイツ・Bad Honnef)
    • Year and Date
      2015-04-26
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research

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Published: 2015-04-16   Modified: 2018-03-28  

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