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2008 Fiscal Year Annual Research Report

表面機能元素の制御と原子構造解析

Planned Research

Project AreaNano Materials Science for Atomic Scale Modification
Project/Area Number 19053006
Research InstitutionOsaka University

Principal Investigator

森田 清三  Osaka University, 大学院・工学研究科, 教授 (50091757)

Co-Investigator(Kenkyū-buntansha) 阿部 真之  大阪大学, 大学院・工学研究科, 准教授 (00362666)
Keywords原子間力顕微鏡 / 表面機能元素 / 元素識別 / へき開機能 / カリウム(K)原子 / AFM / STM同時測定 / 国際研究者交流 / スペイン : チェコ
Research Abstract

1.超高真空中で使えるその場へき開機構を開発して、原子間力顕微鏡を用いたGaAs(110)へき開表面の原子分解能観察実験に成功した。
2.金属酸化物TiO_2(110)表面をアニールやスパッタで清浄化する条件を解明して、TiO_2(110)清浄表面を作成して原子分解能で顕微鏡観察することに成功した。
3.TiO_2(110)清浄表面にカリウム(K)原子を蒸着して、カリウム(K)原子を原子分解能で原子間力顕微鏡観察することに成功した。
4.CaF_2/Si(111)試料でCaFモノレイヤ表面とSi(1,11)7x7表面が混在している場合、接触電位差を補償すると原子レベルで正確な凹凸差が測定できることを、原子間力顕微鏡を用いて明らかにした。
5.金属を蒸着した導電性のテコを使ってSi(111)7x7、TiO_2(110)、Ge(111-c(2x8)、GaAs(110)清浄表面でAFM周波数シフト像とSTMトンネル電流像の原子分解能の同時測定に成功した。
6.多元素系の原子クラスタ・原子ワイヤを原子操作手法で組み立てる基礎研究として、Si(111)-(7x7)上に蒸着したSi原子やSn原子が室温でハーフ・ユニット内に閉じ込められて動き回るのを制御して、ダイマーやトライマーを作成する原子操作実験に成功した。
フォース・マッピング法を(Si,Pb,Sn)/Si(111)-(√<3>×√<3>)表面の原子識別実験に適用し、フォース・マッピングで混在したSi原子とPb原子とSn原子の3元素を識別することに成功した。また、この手法を発展させて、混在した原子の識別を簡単に高速に行える方法の開発に成功した。

  • Research Products

    (48 results)

All 2009 2008 Other

All Journal Article (11 results) (of which Peer Reviewed: 11 results) Presentation (35 results) Book (1 results) Remarks (1 results)

  • [Journal Article] Mapping and imaging for rapid atom discrimination : A study of frequency modulation atomic force micioscopy2009

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Applied Physics Letters Vol.94

      Pages: 023108-1-023108-3

    • Peer Reviewed
  • [Journal Article] "原子ペン",室温で2009

    • Author(s)
      阿部真之
    • Journal Title

      CERAMICS JAPAN Vol.44

      Pages: 126

    • Peer Reviewed
  • [Journal Article] Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy2008

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Science Vol.322

      Pages: 413-417

    • Peer Reviewed
  • [Journal Article] Statistics of lateral atom manipulation by atomic force microscopy at room temperature2008

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Physical Review B Vol.78

      Pages: 205305-1-205305-5

    • Peer Reviewed
  • [Journal Article] Vertical and lateral force mapping on the Si(111)-(7x7)surface by dynamic force microscopy2008

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Physical Review B Vol.77

      Pages: 195424-1-195424-9

    • Peer Reviewed
  • [Journal Article] High Spatial Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2x1)Using Non-contact Atomic Force Microscopy2008

    • Author(s)
      Daisuke Sawada
    • Journal Title

      Japanese Journal ofApplied Physics Vol.47

      Pages: 6085-6087

    • Peer Reviewed
  • [Journal Article] Solution Growth of Rubrene Single Crystals Using Various Organic Solvents2008

    • Author(s)
      Takeshi Matsukawa
    • Journal Title

      Japanese Journal of Applied Physics Vol.47

      Pages: 8950-8954

    • Peer Reviewed
  • [Journal Article] 走査型プローブ顕微鏡2008

    • Author(s)
      森田清三
    • Journal Title

      真空 Vol.51

      Pages: 769-770

    • Peer Reviewed
  • [Journal Article] 走査プローブ顕微鏡一見果てぬ夢のツールー2008

    • Author(s)
      森田清三
    • Journal Title

      応用物理 Vol.77

      Pages: 1049-1058

    • Peer Reviewed
  • [Journal Article] 原子操作で多元素系ナノ材料・ナノデバイスを創る夢2008

    • Author(s)
      森田清三
    • Journal Title

      ATINews 第7号

      Pages: 2-5

    • Peer Reviewed
  • [Journal Article] フォースカーブによる元素識別とフォース・マッピング2008

    • Author(s)
      森田清三
    • Journal Title

      表面科学 Vol.29

      Pages: 214-220

    • Peer Reviewed
  • [Presentation] Development of Atomic Force Microscopy Using Quartz Tuning Fork Operated in Ultra High Vacuum2009

    • Author(s)
      Takashi TERADQ
    • Organizer
      3rdinternational Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
    • Place of Presentation
      Tokyo Internatiorial Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Optical Interferometer for Detection and Excitation of Cantilever Motion : A Study of Atomic Force Microscopy2009

    • Author(s)
      Arushi SATO
    • Organizer
      3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Worlcshop(PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Sensitivity improvement of interferometer for NC-AFM2009

    • Author(s)
      Kenichi INA
    • Organizer
      3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Investigation of excitation method for quartz tuning fork atomic force microscopy2009

    • Author(s)
      Yuki SASAGAWA
    • Organizer
      3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Observation of the metal oxide surface by scanning probe microscopy2009

    • Author(s)
      Hideki TANAKA
    • Organizer
      3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] High Resolution Imaging of TiO_2(110)-(1x1)Using Non-Contact AFM at Low Temperature2009

    • Author(s)
      Abdi PRATAMA
    • Organizer
      3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
    • Place of Presentation
      Tokyo International Exchange, Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] High-resolution imaging of CaF_2/Si(111)surface using atomic resolution NC-AFM2009

    • Author(s)
      Makoto TAKEDA
    • Organizer
      3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Statistics of lateral atom manipulation by atomic force microscopy at room temperature2009

    • Author(s)
      Yuki NAKAJIMA
    • Organizer
      3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
    • Place of Presentation
      Tokyd International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Investigation into small diameter metal tip for force sensor2009

    • Author(s)
      Hitomi HASEGAWA
    • Organizer
      3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
    • Place of Presentation
      Tokyo International Excha nge Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Deflection amplifier for tuning fork operated in ultra-high vacuum2009

    • Author(s)
      Saeidifar SOMAYEH
    • Organizer
      3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Statistics of Lateral Atom Manipulation by Atomic Force Microscopy at Room Temperature2008

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      The 16th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Atagawa, Japan
    • Year and Date
      2008-12-13
  • [Presentation] 走査型プローブ顕微鏡の現状と原子間力顕微鏡の開発2008

    • Author(s)
      森田清三
    • Organizer
      (財)国際高等研究所ワークショップ、2008年度研究プロジェクト「高度計測技術の発展と埋没」
    • Place of Presentation
      財団法人国際高等研究所
    • Year and Date
      2008-11-15
  • [Presentation] 非接触原子間力顕微鏡を用いたフォース・マッピング2008

    • Author(s)
      杉本宜昭
    • Organizer
      社団法人日本表面科学会主催第28回表面科学学術講演会
    • Place of Presentation
      早稲田大学総合学術情報センター(国際会議場)
    • Year and Date
      2008-11-15
  • [Presentation] NC-AFM/STM Study on the Semiconductor Surface2008

    • Author(s)
      Daisuke Sawada
    • Organizer
      The 16th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Atagawa, Janin
    • Year and Date
      2008-11-10
  • [Presentation] Vertical and lateral force mapping by non-contact atomic force microscopy2008

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      International Symposium on Surface Science and Nanotechnology(ISSS-5)
    • Place of Presentation
      Waseda University, Tokyo, Japan
    • Year and Date
      2008-11-10
  • [Presentation] Toward Atom-by-Atom Assembly of Composite Nanostructures Based on Atomic Force Microscopy2008

    • Author(s)
      Seizo Morita
    • Organizer
      21st International Microproceses and Nanotechnology Conference(MNC 2008)
    • Place of Presentation
      Fukuoka, Japan
    • Year and Date
      2008-10-29
  • [Presentation] Atomic. Tool for Nanofabrication Based on Atomic Force Microscopy2008

    • Author(s)
      Seizo Morita
    • Organizer
      55th AVS International Symposium
    • Place of Presentation
      Boston, MA, USA
    • Year and Date
      2008-10-21
  • [Presentation] 走査プローブ顕微鏡の基礎と表面原子操作の最先端2008

    • Author(s)
      森田清三
    • Organizer
      社団法人日本表面科学会主催(2008年秋季)第46回表面科学基礎講座"表面・界面分析の基礎と応用"
    • Place of Presentation
      神戸大学瀧川記念学術交流会館
    • Year and Date
      2008-10-02
  • [Presentation] Observation of the metal oxide surfabe by scanning probe microscopy2008

    • Author(s)
      Akira Hirai
    • Organizer
      4th Handai Nanoscience and technology International Symposium
    • Place of Presentation
      Suita, Japan
    • Year and Date
      2008-09-30
  • [Presentation] NC-AFM/STM measurements on the Ge(111)-c(2x8)Surface2008

    • Author(s)
      Daisuke Sawada
    • Organizer
      4th Handai Nanoscience and technology International Symposium
    • Place of Presentation
      Suita, Japan
    • Year and Date
      2008-09-30
  • [Presentation] Distinction of intermixed ionic atoms on insulating surface of(Ca,Sr)F_22008

    • Author(s)
      Masanori Nagayasu
    • Organizer
      4th Handal Nanoscience and technology International Symposium
    • Place of Presentation
      Suita, Japan
    • Year and Date
      2008-09-30
  • [Presentation] Single atom manipulaiton at room temperature2008

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      4th Handai Nanoscience and technology International Symposium
    • Place of Presentation
      Suita, Japan
    • Year and Date
      2008-09-29
  • [Presentation] 非接触原子間力顕微鏡を用いたSnを蒸着したSi(111)-(7×7)表面での原子操作2008

    • Author(s)
      三木浩太郎
    • Organizer
      旦本金属学会2008年秋季(第143回)大会
    • Place of Presentation
      熊本大学黒髪キャンパス
    • Year and Date
      2008-09-25
  • [Presentation] 非接触原子間力顕微鏡を用いた金属酸化物表面の観察2008

    • Author(s)
      平井明
    • Organizer
      日本金属学会2008年秋季(第143回)大会
    • Place of Presentation
      熊本大学黒髪キャンパス
    • Year and Date
      2008-09-25
  • [Presentation] Force spectroscopy using cantilever higher flexural modes2008

    • Author(s)
      Oscar Custance
    • Organizer
      11th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-19
  • [Presentation] Imaging and Mapping for discriminating atom species using Non-contact Atomic Force Microscopy2008

    • Author(s)
      Masayuki Abe
    • Organizer
      11th International Conference,on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-19
  • [Presentation] Characterizing reactivity of water molecules on CeO_2(111)using atomic fcirce microscopy2008

    • Author(s)
      Stefan Torbrtigge
    • Organizer
      11th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-17
  • [Presentation] Vertical and lateral force mapping on the Si(111)-(7x7)surface by dynamic force microscopy2008

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      11th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-16
  • [Presentation] Distinct short-range electrostatic interaction on Si and substitutional Pb atoms at the Si(111)-(7x7)surface2008

    • Author(s)
      Sascha Sadewasser
    • Organizer
      11 th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-16
  • [Presentation] Unveiling the atomic processes during the manipulation of single atoms at semiconductor surfaces using the FM-AFM in the repulsive regime2008

    • Author(s)
      Pablo Pou
    • Organizer
      11th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-16
  • [Presentation] State-of-the-Art and Future Prospects of Atomic Force Microscopy with Atomic Resolution2008

    • Author(s)
      Seizo Morita
    • Organizer
      the 2008 International Conference on Nanoscience+Technology(ICN+T2008)
    • Place of Presentation
      Colorado, USA
    • Year and Date
      2008-07-23
  • [Presentation] Atom-by-Atom Bottom-up Nanostructuring System Based on Atomic Force Microscopy2008

    • Author(s)
      Seizo Morita
    • Organizer
      Osaka University GCOE Summer Seminar Program for Electronic Devices, Academic Melting-Pot 2008(AMP2008)
    • Place of Presentation
      Suita Campus, Osaka University Japan
    • Year and Date
      2008-07-10
  • [Presentation] Atom-by-Atom Chemical Identification and Following Manipulation on Semiconductor Surfaces Toward Nanostructuring at Room Temperature2008

    • Author(s)
      Seizo Morita
    • Organizer
      the 14th International Conference on Solid Films and Surfaces(ICSFS-14)
    • Place of Presentation
      Trinity College Dublin, Ireland
    • Year and Date
      2008-07-01
  • [Presentation] Imaging of the Si clusters on the Si(111)-(7x7)surfac by using NC-AFM2008

    • Author(s)
      SitOrulWasaki
    • Organizer
      The 1st International Symposium on Advanced Microscopy and Theoretical Calculations(AMTC)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2008-06-30
  • [Presentation] NC-AFM study of phosphorous/Si(001)2x1 surface2008

    • Author(s)
      Daisuke Sawada
    • Organizer
      The 1st International Symposium on Advanced Microscopy and Theoretical Calculations(AMTC)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2008-06-29
  • [Book] 先端計測技術分野科学技術・研究開発の国際比較2008年版「2.国際技術比較、2.1近接場プローブ顕微鏡、2.12中綱目ごとの比較(5)原子間力(AFM)」2008

    • Author(s)
      森田清三(分担執筆)
    • Total Pages
      3
    • Publisher
      独立行政法人科学技術振興機構研究開発戦略センター
  • [Remarks]

    • URL

      http://www.afm.eei.eng.osaka-u.acjp/jp/index.html

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Published: 2010-06-11   Modified: 2016-04-21  

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