2011 Fiscal Year Final Research Report
Novel Nanoprobe Method for Investigating of Electrical and Mechanical Properties of Carbon Nanotubes
| Project Area | Carbon nanotube nanoelectronics |
|---|
| Project/Area Number |
19054010
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research on Priority Areas
|
| Allocation Type | Single-year Grants |
|---|
| Review Section |
Science and Engineering
|
|---|
| Research Institution | Kyoto University |
|---|
Principal Investigator |
YAMADA Hirofumi 京都大学, 大学院・工学研究科, 准教授 (40283626)
|
|---|
| Co-Investigator(Kenkyū-buntansha) |
KOBAYASHI Kei 京都大学, 産官学連携本部, 助教 (40335211)
NODA Kei 京都大学, 工学研究科, 助教 (30372569)
MIYATO Yuji 大阪大学, 基礎工学研究科, 助教 (80512780)
|
|---|
| Project Period (FY) |
2007 – 2011
|
| Keywords | カーボンナノチューブ / 原子間力顕微鏡(AFM) / ケルビンプローブAFM / 周波数変調(FM)検出法 / 高分解能マルチプローブAFM |
|---|
| Research Abstract |
Nanometer-scale investigations of the electrical characteristics of carbon nanotube (CNT) devices in operation are essentially important for understanding of electrical conduction mechanisms in the devices. We have developed novel high-resolution nanoprobe techniques based on atomic force microscopy such as point-by-point stroboscopic scanning gate microscopy capable of visualizing potential barriers including channel defects and high-frequency electric force microscopy which allows us to measure precise local surface potentials without local charge effects.
|
