Detector for ultrafast structure analysis by XFEL

2017 Fiscal Year Final Research Report

• Project Area: Interdisciplinary research on quantum imaging opened with 3D semiconductor detector
• Project/Area Number: 25109007
• Research Category: Grant-in-Aid for Scientific Research on Innovative Areas (Research in a proposed research area)
• Allocation Type: Single-year Grants
• Review Section: Science and Engineering
• Research Institution: Institute of Physical and Chemical Research
• Principal Investigator: Hatsui Takaki 国立研究開発法人理化学研究所, 放射光科学総合研究センター, チームリーダー (40332176)
• Co-Investigator(Kenkyū-buntansha): 阿部 利徳 公益財団法人高輝度光科学研究センター, 光源基盤部門, 研究員 (10570187) ; 寺西 信一 兵庫県立大学, 付置研究所, 特任教授 (20738893) ; 工藤 統吾 公益財団法人高輝度光科学研究センター, その他部局等, 主幹研究員 (40372148) ; 桐原 陽一 国立研究開発法人理化学研究所, 放射光科学総合研究センター, 特別研究員 (30584536)
• Co-Investigator(Renkei-kenkyūsha): Kameshima Takashi 公益財団法人高輝度光科学研究センター, XFEL推進室, 研究員 (50558046)
• Project Period (FY): 2013-06-28 – 2018-03-31
• Keywords: 検出器 / 検出 / X線 / 半導体 / CMOS

Outline of Final Research Achievements

Structual analysis by using X-ray Free-Electron Laser has been attracting wide range of scientific field such as ultrafast chemical reactions of materials and macromolecules of biological interest. This methods, however, demands an X-ray imaging detector that can capture simultaneously the X-ray diffraction patterns as intense as 10,000 photons/pixel at the small angle scattering regime, and wide angle scattering as week as well below single x-ray photon per pixel levels. In addition, the detector need to run at the frame rate matching the fast repetition rate of XFEL. So far, none of the detector has met these demands. In this work, we have successfuly developed a detector SOPHIAS, where newly invented charge division pixel enabled high dynamic rage within a small pixel of 30 um square.

Free Research Field

X線科学