1991 Fiscal Year Final Research Report Summary
Analysis of Atomic Surface Structure Using In-Situ AFM
| Project/Area Number |
02555166
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| Research Category |
Grant-in-Aid for Developmental Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
工業物理化学・複合材料
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| Research Institution | Tohoku Univ. |
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Principal Investigator |
ITAYA Kingo Tohoku Univ., Prof., 工学部, 教授 (40125498)
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| Co-Investigator(Kenkyū-buntansha) |
TOMITA Eisuke Seiko Instruments Inc.,, 機械開発部, 主任
INOUE Akira Seiko Instruments Inc.,, 機械開発部, 次長
ATAKA Tatsuaki Seiko Instruments Inc., Manager, 機械開発部, 課長
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| Project Period (FY) |
1990 – 1991
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| Keywords | AFM / STM / Solid / liquid interface / Electrode surface |
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| Research Abstract |
In-situ characterization of solid(electrode)/solution interfaces is of particularly importance in electrochemical processes occurring at these interfaces. Recently, our group and several other groups have achieved atomic images of some metals or semiconductors at the electrode/solution interface using in situ scanning tunneling microscopy (STM). However, STM measurements has been limited to only electrically conductive materials in which the STM measures tunneling currents between the tip and the sample. On the contrary, the atomic force microscopy (AFM), which is one of the scanning probe microscopes, has been possible to measure the surface structure of nonconductive materials. In this study, we aimed at the development of in situ AFM methods at solid/solution interfaces.
Following results were obtained in our studies so far.
1)Vibration isolation systems, feed back circuits, and other components have been established using an STM apparatus in order to achieve an atomic resolution.
2)Observations of atomic images of gold (Au) and adsorbed species have been achieved in STM measurements.
3)AFM observations of atomic image of mica and graphite have been achieved in a pure water.
4)AFM observations of step-terrace structures on Au(111) have been achieved under the potential controlled.
5)Developments of a commercial available apparatus of AFM made by Seiko Instruments Inc. have been done. This fruit bases on our fundamental results as mentioned above.
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