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1991 Fiscal Year Final Research Report Summary

Estimation of atomic displacement in a unit cell by means of convergent-beam elctron diffraction

Research Project

Project/Area Number 02650467
Research Category

Grant-in-Aid for General Scientific Research (C)

Allocation TypeSingle-year Grants
Research Field Physical properties of metals
Research InstitutionKyushu University

Principal Investigator

TOMOKIYO Yoshitsugu  Kyushu University, Research Laboratory of High Voltage electron Microscope, Associate Professor, 工学部, 助教授 (40037891)

Co-Investigator(Kenkyū-buntansha) MATSUMURA Syo  Kyushu University, Graduate School of Engineering Sciences, Research Associate, 総合理工学研衆科, 助手 (60150520)
Project Period (FY) 1990 – 1991
KeywordsConvergent beam electron diffraction / Large angle convergent beam electron diffraction / Kinematical theory of electron diffraction / Static displacement of atoms / Structure factor / Alumina / 原子の静的変位
Research Abstract

Large angle convergent-beam electron diffraction (LACBED) has been applied to determine structure factors, and following results have been obtained for alpha Al_2O_3.
1. The extinction distance xi_<kappa> for g=0 0 6l for l*5 was found to be much larger than specimen thickness of 150-200 nm suggesting that the kinematical theory of electron diffraction can be applied.
2. When convergent angle of the incident beam is so large that several reflections with l's from 5 to 9 may satisfy Bragg conditions simultaneously and the beam is illuminated onto a small area of specimen, intensities of the Braggreflections can be analyzed with the kinematical approximation.
3. The position of Al ion in alumina was found to be displaced by 0.02435 nm along a C-axis from the ideal position. The static displacement thus evaluated is in good agreement with the one derived by using the dynamical theory of electron diffraction and those obtained by X-ray diffraction, demonstrating the adequateness of the present kinematical treatment.
4. If the temperature factor is ignored in the analysis, the displacements of Al ion is over estimated by about 10%. An accuracy in measurements is improved when a specimen is cooled, since intensities of 0 0 6l reflections change more sensitively with the displacement of Al ion at lower temperature.
5. In the present experiment neighboring reflections were compared to reduce errors originated from background intensities and from non-lineality of darkness of films. The accuracy will be improved and experiments will be easy provided imaging plates or a slow scan CCD camera will be used in place of films.

  • Research Products

    (17 results)

All Other

All Publications (17 results)

  • [Publications] Y.Tomokiyo,N.Kuwano,T.Okuyama,K.Oki,S.Matumura: "Convergent-beam Electron Diffraction for Local Lattice Parameters in III-V Semiconductors" Materials Transactions-Jpn.Inst.Metals. 31. 641-646 (1990)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Matsumura K.Oki T.Okuyama Y.Tomokiyo N.Kuwana: "Dynamical Diffraction Effect on HOLZ-Pattern Geometry for Semiconductor Alloys of Si_1 _xGe_x and Ga_1 _xInAs" Proc.XIIth Int.Cong.for Electron Microscopy,Seattle. 2. 486-487 (1990)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Tomokiyo T.Kuroiwa: "Determination of Static Displacements of Atoms by Means of Large Angle Convergent-Beam Electron Diffraction" Proc.XIIth Int.Cong.for Electron Microscopy,Seattle. 2. 526-527 (1990)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] A.Matsunaga Y.Tomokiyo C.Kinoshita K.Nakai: "Radiation Induced Amorphization and Swelling in Ceramics" J.Nuclear Materials. 179-181. 457-460 (1991)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Yoshino Y.Tomokiyo Y.Suyama: "TEM Observation of Microstructure in Sintered YBa_2Cu_3O_<7 x>" Advances in Superconductivity III,Eds.K.Kajimura & H.Hayakawa Springer-Verlag,Tokyo. 355-358 (1991)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Matsumura Y.Tomokiyo T.Oboshi K.Oki: "High-voltage Electron Diffraction Study of Structure Factors of Pd and Pt" Ultramicroscopy. 39. 65-71 (1991)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S. Matsumura, M. Toyohara, Y. Tomokiyo: "Strain Contrast of Coherent Precipitates in Bright-field Images Under Zone Axis Incidence" Phil. Mag.62, No. 6. 653-670 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Tomokiyo, T. Okuyuam, S. Matsumura, N, Kuwano: "Convergent-beam Electron Diffraction for Local Lattice Parameters In III-V Semiconductors" Mat. Trans-Jpn. Inst. Metals. 31, No. 7. 641-646 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S. Matsumura, T. Okuyama, N. Kuwano, K. Oki, Y. Tomokiyo: "Dynamical Diffraction Effect on HOLZ-Pattern Geometry for Semiconductor Alloys of Si_1 _xGe_x and Ge_<1-x>In_xAs" Proc. XIIth Int. Cong. for EM, Seattle. 2. 486-487 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Tomokiyo, T. Kuroiwa: "Determination of Static Displacements of Atoms by Means of Large angle convergent-Beam Electron Diffraction" Proc. XIIth Int. Cong. for EM, Seattle. 2. 526-527 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Suyama, Y. Tomokiyo, K. Terasaka: "Grain Boundary Structure of ZnO-Bi_2O_3-CoO Varistor" Proc. XIIth Int. Cong. for EM, Seattle. 4. 374-375 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] A. Matsunaga, C. Kinoshita, K. Nakai, Y. Tomokiyo: "Radiation Induced Amorphization and Swelling in Ceramics" J. Nuclear Materials. 179-181. 457-460 (1991)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Yoshino, Y. Tomokiyo, Y. Suyama: "TEM Observation of Microstructure in Sintered YBa_2Cu_3O_<7 x>" Advances in Superconductivity III.Springer-Verlag. 355-358 (1991)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S. Matsumura, T. Oboshi, K. Oki: "High-voltage electron diffraction study of structure factors of Pd and Pt" Ultramicroscopy. 39. 65-71 (1991)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Tomikiyo, T. Kuroiwa, C. Kinoshita: "Defects occurring at or near Surfaces of alpha-Al_2O_3 during electron irradiation" Ultramicroscopy. 39. 213-221 (1991)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Tomokiyo, T. Yoshino, Y. Suyama, T. Manabe, E, Tanaka: "High resolution electron microscopy of sintered YBa_2Cu_3O_<7 x>" Proc. 4th Int. Sympo. on Superconductivity. (1991)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Tomokiyo, Y. Omori, T. Yoshino, T. Fujimoto: "Electron Diffraction of Sintered YBa_2Cu_3O_y and Detection of Local Variation of Oxygen Content" Proc. 6th Japan-China Seminar on EM. (1991)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 1993-03-16  

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