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1993 Fiscal Year Final Research Report Summary

Development of Active Modulation Image Processing Ultra High Resolution Electron Microscope

Research Project

Project/Area Number 04555020
Research Category

Grant-in-Aid for Developmental Scientific Research (B)

Allocation TypeSingle-year Grants
Research Field 応用物理学一般(含航海学)
Research InstitutionOsaka University

Principal Investigator

SHIMIZU Ryuichi  Osaka University, Dept.Applied Physics, Professor., 工学部, 教授 (40029046)

Co-Investigator(Kenkyū-buntansha) TSUNO Katsushige  JEOL Ltd., Lab.Fundamental Res.Manager., 基礎研究室, 室長
IKUTA Takashi  Osaka Electro-Communication University, Dept.Applied Electronics, Professor., 応用電子工学科, 教授 (20103343)
KIMURA Yoshihide  Osaka University, Dept.Applied Physics, Assistant., 工学部, 助手 (70221215)
TAKAI Yoshizo  Osaka University, Dept.Applied Physics, Assoc.Professor., 工学部, 助教授 (30236179)
Project Period (FY) 1992 – 1993
Keywordsactive image processing / ultra high resolution electron microscope / aberration-free observation / real-time image processing / acceleration voltage modulation / staining free observation
Research Abstract

Research has been proceeded as planned. The results are summarized as follows ;
(1) Accelerating voltage modulation type active modulation image processing electron microscope has been successfully developed. We drove the feed back circuit of high voltage power supply in order to superimpose the modulation voltage onto accelerating voltage. This enabled tailored defocus-modulation to be attained by high speed. The result has been reported in paper (1).
(2) We have developed a novel defocus-modulation technique, called functionized irradiation time control method, This method is to control irradiation time of primary beam according to the weight function for defocus-modulation image processing. The first data were described in the paper (2).
(3) Applying this functionized irradiation time control method for active image processing electron microscopy we succeeded in the aberration-free observation of Au-particle. This observation has confirmed that the position of Au-atoms can be determined accurately. (paper (3)).
(4) We have been involved in application of this method for electron microscopic observation of biological samples under just-focus condition. It is noted that these biological samples are no more stained for electron microscopic observation. This reduces significantly the artifact caused by the staining.

  • Research Products

    (8 results)

All Other

All Publications (8 results)

  • [Publications] 安藤俊行,谷口佳史,高井義造,木村吉秀,志水隆一: "Active Image Processing as Applied to High Resolution Electron Microscopy" J.Electron Microscopy. 43. 10-15 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 安藤俊行,谷口佳史,高井義造,木村吉秀,志水隆一: "Development of Real-time Defocus Modulation Type Image Processing for Spherical-aberration-free TEM" Ultramicroscopy. 44(in press). (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 高井義造,谷口佳史,生田孝,志水隆一: "Spherical Aberration-free Observation of Profile Images of Au (011) Surface by Defocus-modulation Image Processing" Ultramicroscopy. 44. (in press) (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 高井義造,谷口佳史,志水隆一: "Determination of Partially Coherent Parameters by Lattice Image Contrast in TEM" J. Electron Microscopy. 42. 7-13 (1993)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 高井義造,大場紀子,安藤俊行,生田孝,志水隆一: "Spherical Aberration-free Imaging by Hollow-cone Illumination Processed by the Focal-Depth Extension Method" Proc 13th International Conf.on Electron Microscopy. (in press). (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Ando, Y.Taniguchi, Y.Takai, Y.Kimura and R.Shimizu: "Active Image Processing as Applied to High Resolution Electron" Microscopy, J.Electron Microscopy. 43. 10-15 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Ando, Y.Taniguchi, Y.Takai, Y.Kimura and R.Shimizu: "Development of Real-Time Defocus Modulation Type Image Processing for Spherical-Aberration-Free TEM." Ultramicroscopy. 44 (in press). (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Takai, Y.Taniguchi, T.Ikuta and R.Shimizu: "Spherical Aberration-Free-Observation of Profile Images of Au (011) Surface by Defocus-Modulation Image Processing." Ultramicroscopy. 44 (in press). (1994)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 1999-03-09  

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